Relativistic Ultrafast Electron Microscopy: Single-Shot Diffraction Imaging with Femtosecond Electron Pulses

We report on a single-shot diffraction imaging methodology using relativistic femtosecond electron pulses generated by a radio-frequency acceleration-based photoemission gun. The electron pulses exhibit excellent characteristics, including a root-mean-square (rms) illumination convergence of 31 ± 2...

Full description

Saved in:
Bibliographic Details
Published in:Advances in condensed matter physics 2019-01, Vol.2019 (2019), p.1-6
Main Authors: Yang, Jinfeng, Yoshida, Yoichi
Format: Article
Language:English
Subjects:
Acceleration
Applied physics
Beams (radiation)
Coherence length
Diffraction
Electron pulses
Electrons
Energy
Femtosecond pulses
Gold
Image quality
Laboratories
Lasers
Microscopy
Photoelectric emission
Pulse duration
Radio frequency
Relativism
Relativistic effects
Shot
Single crystals
Spatial resolution
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report on a single-shot diffraction imaging methodology using relativistic femtosecond electron pulses generated by a radio-frequency acceleration-based photoemission gun. The electron pulses exhibit excellent characteristics, including a root-mean-square (rms) illumination convergence of 31 ± 2 μrad, a spatial coherence length of 5.6 ± 0.4 nm, and a pulse duration of approximately 100 fs with (6.3 ± 0.6) × 106 electrons per pulse at 3.1 MeV energy. These pulses facilitate high-quality diffraction images of gold single crystals with a single shot. The rms spot width of the diffracted beams was obtained as 0.018 ± 0.001 Å−1, indicating excellent spatial resolution.
ISSN:1687-8108
1687-8124
DOI:10.1155/2019/9739241