Joint Modeling of Linear Degradation and Multiple Dependent Competing Risks Data under a Step-Stress Accelerated Degradation Test

• Published in: Journal of statistical theory and applications 2018-06, Vol.17 (2), p.340-358
• Main Authors: Mireh, Somayeh, Khodadadi, Ahmad, Haghighi, Firoozeh
• Format: Article
• Language: English
• Subjects: Accelerated tests; Copula Function; Datasets; Degradation; Dependent Competing Risk; Failure modes; Failure times; Light emitting diodes; Modelling; Reliability Function; Research Article; Sensitivity analysis; Step-Stress Accelerated Degradation Test; Substrates; Test facilities; Time dependence
• ISSN: 1538-7887; 2214-1766; 1538-7887
• DOI: 10.2991/jsta.2018.17.2.12

The step-stress accelerated degradation test (SSADT) is one of the most commonly used time-dependent types of stress loading tests that enables a shorter test duration. This test is more economical and flexible compared to accelerated degradation test or accelerated failure time (ADT/AFT) test plans. This test is suitable when constraints by test facilities, conditions, or samples exist. SSADT is more useful for developing products when there is inadequate knowledge for test conditions. Important aspects here are to evaluate each failure mode in the presence of the other modes by assuming some dependency structure between the failure modes due to the non-applicability of studying test units with isolated competing failure modes. This paper aims to propose a modeling approach to simultaneously analyze linear degradation data and failure time data with dependent competing risks in an SSADT experiment. We use the copula function to consider the dependency structures between two failure modes. The proposed model is applied to acceleration data, to simulation data sets and two real data sets- bus tire data set and plastic substrate active matrix light-emitting diodes (AMOLED) data set, accompanied by sensitivity analysis.