Fast acquisition protocol for X-ray scattering tensor tomography

Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols...

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Bibliographic Details
Published in:Scientific reports 2021-11, Vol.11 (1), p.23046-13, Article 23046
Main Authors: Kim, Jisoo, Kagias, Matias, Marone, Federica, Shi, Zhitian, Stampanoni, Marco
Format: Article
Language:English
Subjects:
639/624/1107/328/1651
639/624/1107/510
639/766/400/1106
639/766/930/2735
Humanities and Social Sciences
Interferometry
multidisciplinary
Optics
Science
Science (multidisciplinary)
Tomography
X-ray scattering
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Summary:Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. X-ray scattering tensor tomography with the use of this circular grating array has been demonstrated. We propose here simple yet inherently rapid acquisition protocols for X-ray scattering tensor tomography leveraging on these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.
ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-021-02467-w