STABILITY AND PERFORMANCE CHARACTERIZATION OF THICK FILM MICRORESISTORS

In recent years, interest in the performance of small dimension resistors has increased primarily due to the need to reduce parasitic resistance in high frequency applications. This paper presents results on the characterization of thick film microresistors, i.e. resistors of 80 × 80 mil to 10 × 10...

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Bibliographic Details
Published in:Active and Passive Electronic Components 1987, Vol.1987 (4), p.231-237
Main Author: RAVI, S. C
Format: Article
Language:English
Subjects:
Applied sciences
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
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Summary:In recent years, interest in the performance of small dimension resistors has increased primarily due to the need to reduce parasitic resistance in high frequency applications. This paper presents results on the characterization of thick film microresistors, i.e. resistors of 80 × 80 mil to 10 × 10 mil dimension.
ISSN:0882-7516
1563-5031
DOI:10.1155/1987/61728