STABILITY AND PERFORMANCE CHARACTERIZATION OF THICK FILM MICRORESISTORS

In recent years, interest in the performance of small dimension resistors has increased primarily due to the need to reduce parasitic resistance in high frequency applications. This paper presents results on the characterization of thick film microresistors, i.e. resistors of 80 × 80 mil to 10 × 10...

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Published in:Active and Passive Electronic Components 1987, Vol.1987 (4), p.231-237
Main Author: RAVI, S. C
Format: Article
Language:English
Subjects:
Applied sciences
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
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container_title Active and Passive Electronic Components
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creator RAVI, S. C
description In recent years, interest in the performance of small dimension resistors has increased primarily due to the need to reduce parasitic resistance in high frequency applications. This paper presents results on the characterization of thick film microresistors, i.e. resistors of 80 × 80 mil to 10 × 10 mil dimension.
doi_str_mv 10.1155/1987/61728
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identifier ISSN: 0882-7516
ispartof Active and Passive Electronic Components, 1987, Vol.1987 (4), p.231-237
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language eng
recordid cdi_doaj_primary_oai_doaj_org_article_2afbf28dde4c45b9ba8969d0f6825a6b
source Open Access: Wiley-Blackwell Open Access Journals; IngentaConnect Journals
subjects Applied sciences
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
title STABILITY AND PERFORMANCE CHARACTERIZATION OF THICK FILM MICRORESISTORS
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