Scanning Probe Microscopy on heterogeneous CaCu3Ti4O12 thin films

The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu 3 Ti 4 O 12 (CCTO) thin films deposited by MOCVD on IrO 2 bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular features...

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Bibliographic Details
Published in:Nanoscale research letters 2011-02, Vol.6 (1), p.118-118, Article 118
Main Authors: Fiorenza, Patrick, Lo Nigro, Raffaella, Raineri, Vito
Format: Article
Language:English
Subjects:
Advanced Materials Nanocharacterization
Chemistry and Materials Science
Materials Science
Molecular Medicine
Nano Express
Nanochemistry
Nanoscale Science and Technology
Nanotechnology
Nanotechnology and Microengineering
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Summary:The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu 3 Ti 4 O 12 (CCTO) thin films deposited by MOCVD on IrO 2 bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular features in terms of conductive and insulating regions. The microstructure and the dielectric properties of CCTO thin films have been studied and the evidence of internal barriers in CCTO thin films has been provided. The role of internal barriers and the possible explanation for the extrinsic origin of the giant dielectric response in CCTO has been evaluated.
ISSN:1556-276X
1931-7573
1556-276X
DOI:10.1186/1556-276X-6-118