Method and Equipment for Reducing the Efficiency Degradation of Monocrystalline Passivated Emitter and Rear Cells

• Published in: Energies (Basel) 2024-04, Vol.17 (7), p.1550
• Main Authors: Fan, Weitao, Shen, Honglie, Zhang, Xin, Pan, Hong
• Format: Article
• Language: English
• Subjects: current injection; Efficiency; electrical performance parameters; LeTID; Screen printing; Silicon; Silicon wafers; solar cell; Temperature
• ISSN: 1996-1073; 1996-1073
• DOI: 10.3390/en17071550

Infrared soldering as a step in module encapsulation, which would cause light-induced degradation (LID) and light- and elevated-temperature-induced degradation (LeTID) effects on solar cells, may cause efficiency mixing among solar cells that were originally in the same grade within the module after soldering. Furthermore, the problem of bright and dark regions would appear, which would result in a decrease in the CTM value. Current injection is considered to be one of the effective methods to solve the above problem. However, after the current injection treatment, there is still a 10% probability of the appearance of bright and dark regions in modules. In this work, we first adopted the conventional current injection process in monocrystalline passivated emitter and rear cells (PERCs). The effects of injected currents, temperature and time were systematically optimized, and cells with or without the current injection under the optimal parameters were illuminated with 1 sun at 85 °C for 25 h. Secondly, a piece of equipment was developed to further stabilize the performance of solar cells and improve the CTM value. The results showed that the best current injection parameters were a temperature of 185 °C, an injected current of 11 A and an injection time of 770 s. Compared with the cells without any pretreatment, the relative changes in the η, Voc, Isc and FF of the cells pretreated with the optimal conditions mentioned above were 0.23%, 0.08%, 0.02% and 0.08% larger, respectively, after 25 h of degradation. Then, solar cells processed by current injection were processed with our equipment, and the probability of a problem occurring was reduced from 10% to 2%. Meanwhile, the CTM value increased by 0.4%. Finally, a balance mechanism between H0 and H0-X has been proposed to explain the mechanism of the equipment.