Line Defect-Layered EBG Waveguides in Dielectric Substrates

A dielectric-based multilayer structure composed of U-shaped rings (ML-UR) is used to develop a class of novel electromagnetic band gap (EBG) slab waveguide. The structure has two band gaps that narrow down as dielectric constant is increased. The EBG slab waveguide is created by embedding a single-...

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Bibliographic Details
Published in:International journal of antennas and propagation 2018-01, Vol.2018 (2018), p.1-9
Main Authors: Hettak, Khelifa, Roy, Langis, Shaker, Jafar, Ouassal, Hassna, Chaharmir, Reza
Format: Article
Language:English
Subjects:
Antenna arrays
Band gap
Boundary conditions
Crystal defects
Defects
Directional couplers
Insertion loss
Lattices
Multilayers
Phase shifters
Reliability engineering
Structural reliability
Substrates
Waveguides
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Summary:A dielectric-based multilayer structure composed of U-shaped rings (ML-UR) is used to develop a class of novel electromagnetic band gap (EBG) slab waveguide. The structure has two band gaps that narrow down as dielectric constant is increased. The EBG slab waveguide is created by embedding a single-layer line defect inside the 3D crystal of the EBG slab guide. Unlike our previously published foam-based EBG structure, the use of dielectric spacer in the EBG waveguides offers significant advantages in terms of overall size, structure reliability, and design flexibility. The waveguide structures reported in this paper are designed to operate at X-band (8–12 GHz) while being fed by coplanar-slotline transitions. Prototypes were fabricated and characterized experimentally. The insertion loss decreases by decreasing the number of full lattices of ML-UR surrounding the channels. The proposed waveguide has potential in microwave components such as directional couplers, phase shifters, and antenna array feeding networks.
ISSN:1687-5869
1687-5877
DOI:10.1155/2018/3469730