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Line Defect-Layered EBG Waveguides in Dielectric Substrates
A dielectric-based multilayer structure composed of U-shaped rings (ML-UR) is used to develop a class of novel electromagnetic band gap (EBG) slab waveguide. The structure has two band gaps that narrow down as dielectric constant is increased. The EBG slab waveguide is created by embedding a single-...
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Published in: | International journal of antennas and propagation 2018-01, Vol.2018 (2018), p.1-9 |
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container_title | International journal of antennas and propagation |
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creator | Hettak, Khelifa Roy, Langis Shaker, Jafar Ouassal, Hassna Chaharmir, Reza |
description | A dielectric-based multilayer structure composed of U-shaped rings (ML-UR) is used to develop a class of novel electromagnetic band gap (EBG) slab waveguide. The structure has two band gaps that narrow down as dielectric constant is increased. The EBG slab waveguide is created by embedding a single-layer line defect inside the 3D crystal of the EBG slab guide. Unlike our previously published foam-based EBG structure, the use of dielectric spacer in the EBG waveguides offers significant advantages in terms of overall size, structure reliability, and design flexibility. The waveguide structures reported in this paper are designed to operate at X-band (8–12 GHz) while being fed by coplanar-slotline transitions. Prototypes were fabricated and characterized experimentally. The insertion loss decreases by decreasing the number of full lattices of ML-UR surrounding the channels. The proposed waveguide has potential in microwave components such as directional couplers, phase shifters, and antenna array feeding networks. |
doi_str_mv | 10.1155/2018/3469730 |
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The proposed waveguide has potential in microwave components such as directional couplers, phase shifters, and antenna array feeding networks.</description><subject>Antenna arrays</subject><subject>Band gap</subject><subject>Boundary conditions</subject><subject>Crystal defects</subject><subject>Defects</subject><subject>Directional couplers</subject><subject>Insertion loss</subject><subject>Lattices</subject><subject>Multilayers</subject><subject>Phase shifters</subject><subject>Reliability engineering</subject><subject>Structural reliability</subject><subject>Substrates</subject><subject>Waveguides</subject><issn>1687-5869</issn><issn>1687-5877</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><sourceid>DOA</sourceid><recordid>eNqF0c1LwzAYBvAiCn7ePEvBo9bls2nwpM6PQcGDiseQJm80Y7Yz6ZT992Z2zKOnhPDjycvzZtkxRhcYcz4iCFcjykopKNrK9nBZiYJXQmxv7qXczfZjnCJUUkLoXnZZ-xbyMTgwfVHrJQSw-e31ff6qv-Bt4S3E3Lf52MMsieBN_rRoYh90D_Ew23F6FuFofR5kL3e3zzcPRf14P7m5qgvDJO0LjRnXEqiQuGkQsRpz1zjOsKTEYF2ZhjtnqtKKBkCUSGhBGXUC0UpIaQQ9yCZDru30VM2D_9BhqTrt1e9DF96UDr03M1AMAQfquObGMUFcSkDWCs4sMRJLkrJOh6x56D4XEHs17RahTeMrgrhARKZpkzoflAldjAHc5leM1KpqtaparatO_Gzg7761-tv_p08GDcmA0386LYmJkv4AwViFJA</recordid><startdate>20180101</startdate><enddate>20180101</enddate><creator>Hettak, Khelifa</creator><creator>Roy, Langis</creator><creator>Shaker, Jafar</creator><creator>Ouassal, Hassna</creator><creator>Chaharmir, Reza</creator><general>Hindawi Publishing Corporation</general><general>Hindawi</general><general>Hindawi Limited</general><scope>ADJCN</scope><scope>AHFXO</scope><scope>RHU</scope><scope>RHW</scope><scope>RHX</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>CWDGH</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0003-0269-7748</orcidid></search><sort><creationdate>20180101</creationdate><title>Line Defect-Layered EBG Waveguides in Dielectric Substrates</title><author>Hettak, Khelifa ; 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subjects | Antenna arrays Band gap Boundary conditions Crystal defects Defects Directional couplers Insertion loss Lattices Multilayers Phase shifters Reliability engineering Structural reliability Substrates Waveguides |
title | Line Defect-Layered EBG Waveguides in Dielectric Substrates |
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