Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress

Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under el...

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Published in:Applied sciences 2021-08, Vol.11 (16), p.7627
Main Authors: Lee, Gyeong Won, Choi, Yoonsuk, Kim, Heejin, Park, Jongwoo, Shim, Jong-In, Shin, Dong-Soo
Format: Article
Language:English
Subjects:
Carrier recombination
charge recombination and transport
Chemical reactions
Degradation
Efficiency
Electron transport
Fluorescence
Glass substrates
Light emitting diodes
Organic light emitting diodes
Recombination
Stress
transient
Trends
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cited_by cdi_FETCH-LOGICAL-c364t-a5c2be729cc35e1033a8a5c76382bd0ae3d5bc8ba9571d77a90a6d4392fcb0ec3
cites cdi_FETCH-LOGICAL-c364t-a5c2be729cc35e1033a8a5c76382bd0ae3d5bc8ba9571d77a90a6d4392fcb0ec3
container_end_page
container_issue 16
container_start_page 7627
container_title Applied sciences
container_volume 11
creator Lee, Gyeong Won
Choi, Yoonsuk
Kim, Heejin
Park, Jongwoo
Shim, Jong-In
Shin, Dong-Soo
description Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.
doi_str_mv 10.3390/app11167627
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fullrecord <record><control><sourceid>proquest_doaj_</sourceid><recordid>TN_cdi_doaj_primary_oai_doaj_org_article_457179b0fb09493bac6cd5634cc7d6a5</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><doaj_id>oai_doaj_org_article_457179b0fb09493bac6cd5634cc7d6a5</doaj_id><sourcerecordid>2564635256</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-a5c2be729cc35e1033a8a5c76382bd0ae3d5bc8ba9571d77a90a6d4392fcb0ec3</originalsourceid><addsrcrecordid>eNpNkVFLwzAUhYsoOOae_AMBH6WaNG3SPM5t6mCwB-dzuE3SLqNrapIJ-_fWTWT35VwOh-_CPUlyT_ATpQI_Q98TQhhnGb9KRhnmLKU54dcX-20yCWGHhxGElgSPEj3toD0GG5Cr0cZDF6zpIpqbxoOGaF2HXswWvq3zp8jaN9BZhVa22cZ0sbcx2q5Bc-u0CejQaePRojUqequgRR_RmxDukpsa2mAmfzpOPl8Xm9l7ulq_LWfTVaooy2MKhcoqwzOhFC0MwZRCOXic0TKrNAZDdVGpsgJRcKI5B4GB6ZyKrFYVNoqOk-WZqx3sZO_tHvxROrDyZDjfSPDRqtbIfEBwUeG6wiIXtALFlC4YzZXimkExsB7OrN67r4MJUe7cwQ_PCjIrWM5oMciQejynlHcheFP_XyVY_rYiL1qhP9ezf-o</addsrcrecordid><sourcetype>Open Website</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2564635256</pqid></control><display><type>article</type><title>Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress</title><source>Publicly Available Content Database</source><creator>Lee, Gyeong Won ; Choi, Yoonsuk ; Kim, Heejin ; Park, Jongwoo ; Shim, Jong-In ; Shin, Dong-Soo</creator><creatorcontrib>Lee, Gyeong Won ; Choi, Yoonsuk ; Kim, Heejin ; Park, Jongwoo ; Shim, Jong-In ; Shin, Dong-Soo</creatorcontrib><description>Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.</description><identifier>ISSN: 2076-3417</identifier><identifier>EISSN: 2076-3417</identifier><identifier>DOI: 10.3390/app11167627</identifier><language>eng</language><publisher>Basel: MDPI AG</publisher><subject>Carrier recombination ; charge recombination and transport ; Chemical reactions ; Degradation ; Efficiency ; Electron transport ; Fluorescence ; Glass substrates ; Light emitting diodes ; Organic light emitting diodes ; Recombination ; Stress ; transient ; Trends</subject><ispartof>Applied sciences, 2021-08, Vol.11 (16), p.7627</ispartof><rights>2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-a5c2be729cc35e1033a8a5c76382bd0ae3d5bc8ba9571d77a90a6d4392fcb0ec3</citedby><cites>FETCH-LOGICAL-c364t-a5c2be729cc35e1033a8a5c76382bd0ae3d5bc8ba9571d77a90a6d4392fcb0ec3</cites><orcidid>0000-0002-0863-9138</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.proquest.com/docview/2564635256/fulltextPDF?pq-origsite=primo$$EPDF$$P50$$Gproquest$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.proquest.com/docview/2564635256?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>314,776,780,25731,27901,27902,36989,44566,75096</link.rule.ids></links><search><creatorcontrib>Lee, Gyeong Won</creatorcontrib><creatorcontrib>Choi, Yoonsuk</creatorcontrib><creatorcontrib>Kim, Heejin</creatorcontrib><creatorcontrib>Park, Jongwoo</creatorcontrib><creatorcontrib>Shim, Jong-In</creatorcontrib><creatorcontrib>Shin, Dong-Soo</creatorcontrib><title>Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress</title><title>Applied sciences</title><description>Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.</description><subject>Carrier recombination</subject><subject>charge recombination and transport</subject><subject>Chemical reactions</subject><subject>Degradation</subject><subject>Efficiency</subject><subject>Electron transport</subject><subject>Fluorescence</subject><subject>Glass substrates</subject><subject>Light emitting diodes</subject><subject>Organic light emitting diodes</subject><subject>Recombination</subject><subject>Stress</subject><subject>transient</subject><subject>Trends</subject><issn>2076-3417</issn><issn>2076-3417</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><sourceid>DOA</sourceid><recordid>eNpNkVFLwzAUhYsoOOae_AMBH6WaNG3SPM5t6mCwB-dzuE3SLqNrapIJ-_fWTWT35VwOh-_CPUlyT_ATpQI_Q98TQhhnGb9KRhnmLKU54dcX-20yCWGHhxGElgSPEj3toD0GG5Cr0cZDF6zpIpqbxoOGaF2HXswWvq3zp8jaN9BZhVa22cZ0sbcx2q5Bc-u0CejQaePRojUqequgRR_RmxDukpsa2mAmfzpOPl8Xm9l7ulq_LWfTVaooy2MKhcoqwzOhFC0MwZRCOXic0TKrNAZDdVGpsgJRcKI5B4GB6ZyKrFYVNoqOk-WZqx3sZO_tHvxROrDyZDjfSPDRqtbIfEBwUeG6wiIXtALFlC4YzZXimkExsB7OrN67r4MJUe7cwQ_PCjIrWM5oMciQejynlHcheFP_XyVY_rYiL1qhP9ezf-o</recordid><startdate>20210801</startdate><enddate>20210801</enddate><creator>Lee, Gyeong Won</creator><creator>Choi, Yoonsuk</creator><creator>Kim, Heejin</creator><creator>Park, Jongwoo</creator><creator>Shim, Jong-In</creator><creator>Shin, Dong-Soo</creator><general>MDPI AG</general><scope>AAYXX</scope><scope>CITATION</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>PHGZM</scope><scope>PHGZT</scope><scope>PIMPY</scope><scope>PKEHL</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0002-0863-9138</orcidid></search><sort><creationdate>20210801</creationdate><title>Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress</title><author>Lee, Gyeong Won ; Choi, Yoonsuk ; Kim, Heejin ; Park, Jongwoo ; Shim, Jong-In ; Shin, Dong-Soo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-a5c2be729cc35e1033a8a5c76382bd0ae3d5bc8ba9571d77a90a6d4392fcb0ec3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Carrier recombination</topic><topic>charge recombination and transport</topic><topic>Chemical reactions</topic><topic>Degradation</topic><topic>Efficiency</topic><topic>Electron transport</topic><topic>Fluorescence</topic><topic>Glass substrates</topic><topic>Light emitting diodes</topic><topic>Organic light emitting diodes</topic><topic>Recombination</topic><topic>Stress</topic><topic>transient</topic><topic>Trends</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, Gyeong Won</creatorcontrib><creatorcontrib>Choi, Yoonsuk</creatorcontrib><creatorcontrib>Kim, Heejin</creatorcontrib><creatorcontrib>Park, Jongwoo</creatorcontrib><creatorcontrib>Shim, Jong-In</creatorcontrib><creatorcontrib>Shin, Dong-Soo</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>ProQuest Central (New)</collection><collection>ProQuest One Academic (New)</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Middle East (New)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DAOJ: Directory of Open Access Journals</collection><jtitle>Applied sciences</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, Gyeong Won</au><au>Choi, Yoonsuk</au><au>Kim, Heejin</au><au>Park, Jongwoo</au><au>Shim, Jong-In</au><au>Shin, Dong-Soo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress</atitle><jtitle>Applied sciences</jtitle><date>2021-08-01</date><risdate>2021</risdate><volume>11</volume><issue>16</issue><spage>7627</spage><pages>7627-</pages><issn>2076-3417</issn><eissn>2076-3417</eissn><abstract>Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.</abstract><cop>Basel</cop><pub>MDPI AG</pub><doi>10.3390/app11167627</doi><orcidid>https://orcid.org/0000-0002-0863-9138</orcidid><oa>free_for_read</oa></addata></record>
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ispartof Applied sciences, 2021-08, Vol.11 (16), p.7627
issn 2076-3417
2076-3417
language eng
recordid cdi_doaj_primary_oai_doaj_org_article_457179b0fb09493bac6cd5634cc7d6a5
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subjects Carrier recombination
charge recombination and transport
Chemical reactions
Degradation
Efficiency
Electron transport
Fluorescence
Glass substrates
Light emitting diodes
Organic light emitting diodes
Recombination
Stress
transient
Trends
title Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-22T11%3A53%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_doaj_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20of%20Transient%20Degradation%20Behaviors%20of%20Organic%20Light-Emitting%20Diodes%20under%20Electrical%20Stress&rft.jtitle=Applied%20sciences&rft.au=Lee,%20Gyeong%20Won&rft.date=2021-08-01&rft.volume=11&rft.issue=16&rft.spage=7627&rft.pages=7627-&rft.issn=2076-3417&rft.eissn=2076-3417&rft_id=info:doi/10.3390/app11167627&rft_dat=%3Cproquest_doaj_%3E2564635256%3C/proquest_doaj_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c364t-a5c2be729cc35e1033a8a5c76382bd0ae3d5bc8ba9571d77a90a6d4392fcb0ec3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2564635256&rft_id=info:pmid/&rfr_iscdi=true