Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a la...

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Bibliographic Details
Published in:Beilstein journal of nanotechnology 2013-01, Vol.4 (1), p.10-19
Main Authors: Stirling, Julian, Shaw, Gordon A
Format: Article
Language:English
Subjects:
atomic force microscopy
force spectroscopy
Full Research Paper
lateral forces
mechanical vibrations
Nanoscience
Nanotechnology
qPlus
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Summary:In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.
ISSN:2190-4286
2190-4286
DOI:10.3762/bjnano.4.2