Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a la...

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Published in:Beilstein journal of nanotechnology 2013-01, Vol.4 (1), p.10-19
Main Authors: Stirling, Julian, Shaw, Gordon A
Format: Article
Language:English
Subjects:
atomic force microscopy
force spectroscopy
Full Research Paper
lateral forces
mechanical vibrations
Nanoscience
Nanotechnology
qPlus
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description In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.
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source Full-Text Journals in Chemistry (Open access); PubMed Central
subjects atomic force microscopy
force spectroscopy
Full Research Paper
lateral forces
mechanical vibrations
Nanoscience
Nanotechnology
qPlus
title Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor
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