Design and development of test bench for pocket labs

• Published in: Discover Electronics 2024-11, Vol.1 (1), p.1-14, Article 25
• Main Authors: Shah, Muhammad Omer, Khan, Awais, Ilyas, Muhammad, Rauf, Arshad, Qamar, Aamir
• Format: Article
• Language: English
• Subjects: Analog; Case Study; Data acquisition; Digital; Electrical Engineering; Electronic Circuits and Devices; Engineering; MyDAQ; National instrument; Optical and Electronic Materials
• ISSN: 2948-1600; 2948-1600
• DOI: 10.1007/s44291-024-00030-1

Portable data acquisition devices, such as the National Instrument (NI) myDAQ, allow users to analyze electronic circuits without advanced measurement systems, making them invaluable in educational settings. Combined with NI Laboratory Virtual Instrument Engineering Workbench (LabVIEW) on a personal computer, the NI myDAQ facilitates practical experiments and analyses anytime, anywhere. However, these devices can malfunction due to misuse or operation beyond their design limitations. This research presents the design, operation, and implementation of an energy-efficient test bench for the control and measurement functionalities of the NI myDAQ, aimed at detecting device failures through a specialized hardware and software setup using the loopback method. The test bench efficiently verifies all input and output ports, providing fast and accurate fault detection, and generates detailed performance reports to aid in long-term monitoring. By automating fault detection and reducing manual intervention, this setup ensures reliable operation, making it an ideal, resource-efficient solution for educational environments where practical, portable systems are essential for hands-on learning.