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Phase segregation due to ion migration in all-inorganic mixed-halide perovskite nanocrystals
Semiconductor mixed-halide perovskites featured with a tunable energy bandgap are ideal candidates for light absorbers in tandem solar cells as well as fluorescent materials in light-emitting diodes and nanoscale lasers. These device advancements are currently hindered by the light-induced phase seg...
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Published in: | Nature communications 2019-03, Vol.10 (1), p.1088-1088, Article 1088 |
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Main Authors: | , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Semiconductor mixed-halide perovskites featured with a tunable energy bandgap are ideal candidates for light absorbers in tandem solar cells as well as fluorescent materials in light-emitting diodes and nanoscale lasers. These device advancements are currently hindered by the light-induced phase segregation effect, whereby ion migration would yield smaller-bandgap domains with red-shifted photoluminescence. Here we show that upon laser excitation all-inorganic mixed-halide nanocrystals unexpectedly exhibit a blue shift in the photoluminescence peak that can revert back in the dark, thus depicting the processes of ion migration out of and back to the originally excited nanocrystals. Interestingly, this reversible photoluminescence shift can also be induced by electrical biasing of mixed-halide nanocrystals without the injection of charge carriers. The above findings suggest that it is the local electric field that breaks the ionic bonds in mixed-halide nanocrystals, which could be a universal origin for light-induced phase segregation observed in other mixed-halide perovskite materials.
Mixed-halide perovskites possess excellent semiconductor properties but suffer severely from notorious light-induced phase segregation effect. Here Zhang et al. employ simple photoluminescence measurements to link the effect to the local electric field induced ion migration process. |
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ISSN: | 2041-1723 2041-1723 |
DOI: | 10.1038/s41467-019-09047-7 |