Ab initio nonrigid X-ray nanotomography

Reaching the full potential of X-ray nanotomography, in particular for biological samples, is limited by many factors, of which one of the most serious is radiation damage. Although sample deformation caused by radiation damage can be partly mitigated by cryogenic protection, it is still present in...

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Bibliographic Details
Published in:Nature communications 2019-06, Vol.10 (1), p.2600-9, Article 2600
Main Authors: Odstrcil, Michal, Holler, Mirko, Raabe, Jörg, Sepe, Alessandro, Sheng, Xiaoyuan, Vignolini, Silvia, Schroer, Christian G., Guizar-Sicairos, Manuel
Format: Article
Language:English
Subjects:
639/624/1107/328/968
639/766/400/1106
639/925/930/2735
Animal Scales - diagnostic imaging
Animals
Biological properties
Biological samples
Coleoptera
Deformation
Deformation mechanisms
Humanities and Social Sciences
Image resolution
Imaging, Three-Dimensional - methods
Medical imaging
multidisciplinary
Nanotechnology - methods
Radiation
Radiation damage
Reconstruction
Science
Science (multidisciplinary)
Tomography, X-Ray Computed - methods
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Summary:Reaching the full potential of X-ray nanotomography, in particular for biological samples, is limited by many factors, of which one of the most serious is radiation damage. Although sample deformation caused by radiation damage can be partly mitigated by cryogenic protection, it is still present in these conditions and, as we exemplify here using a specimen extracted from scales of the Cyphochilus beetle, it will pose a limit to the achievable imaging resolution. We demonstrate a generalized tomographic model, which optimally follows the sample morphological changes and attempts to recover the original sample structure close to the ideal, damage-free reconstruction. Whereas our demonstration was performed using ptychographic X-ray tomography, the method can be adopted for any tomographic imaging modality. Our application demonstrates improved reconstruction quality of radiation-sensitive samples, which will be of increasing relevance with the higher brightness of 4th generation synchrotron sources. Radiation induced sample deformation can be a limiting factor for X-ray imaging resolution at the nanoscale. The authors report a tomographic model that estimates and accounts for morphological changes during data acquisition and enables reconstruction of a high-resolution image ab initio.
ISSN:2041-1723
2041-1723
DOI:10.1038/s41467-019-10670-7