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Capacitor Reused Gate Driver for Compact In-Cell Touch Displays
A thin-film transistor (TFT) integrated gate driver is proposed for compact in-cell touch display, where one capacitor is reused for both turning on low-level maintaining transistors via voltage coupling and maintaining the re-start charge during the touch sensing period. The gate terminal of buffer...
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Published in: | IEEE journal of the Electron Devices Society 2021, Vol.9, p.533-538 |
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creator | Shen, Shuai Liao, Congwei Yang, Jiwen Jiao, Hailong Zhang, Shengdong |
description | A thin-film transistor (TFT) integrated gate driver is proposed for compact in-cell touch display, where one capacitor is reused for both turning on low-level maintaining transistors via voltage coupling and maintaining the re-start charge during the touch sensing period. The gate terminal of buffer transistor is thus free of electrical stress during touch sensing period, and can be re-charged for the subsequent re-start period, leading to minimal variations in the transient response. With the capacitor reusing scheme and a capacitor stacking structure, the area of the single stage gate driver is decreased to 645\,\,\mu \text{m}\,\,\times 210\,\,\mu \text{m} . The fabricated a-Si TFT gate driver with 8 cascaded stages shows that the rising and falling time variations among re-start and normal gate driver stages are less than 1~\mu \text{s} . Versatile touch sensing modes and bidirectional scanning functions are verified. |
doi_str_mv | 10.1109/JEDS.2021.3077141 |
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fullrecord | <record><control><sourceid>proquest_doaj_</sourceid><recordid>TN_cdi_doaj_primary_oai_doaj_org_article_5aa46b25dfc8458a8e895bfe75d4e92e</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9420745</ieee_id><doaj_id>oai_doaj_org_article_5aa46b25dfc8458a8e895bfe75d4e92e</doaj_id><sourcerecordid>2526964483</sourcerecordid><originalsourceid>FETCH-LOGICAL-c435t-566b322360c1fb7671bfe7c53518628cbb219359e1cb82dba094082a0eaea70e3</originalsourceid><addsrcrecordid>eNpNkE9Lw0AQxYMoWGo_gHgJeE7d_9mcRFKtlYKg9bzsbiaaknbjbiL025uYUpzLDMOb94ZfFF1jNMcYZXcvj4v3OUEEzylKU8zwWTQhWMhEpJSd_5svo1kIW9SXxCITYhLd57rRtmqdj9-gC1DES91CvPDVD_i47Ne52_WKNl7tkxzqOt64zn7Fiyo0tT6Eq-ii1HWA2bFPo4-nx03-nKxfl6v8YZ1YRnmbcCEMJYQKZHFpUpFiU0JqOeVYCiKtMQRnlGeArZGkMBplDEmiEWjQKQI6jVajb-H0VjW-2ml_UE5X6m_h_KfSvq1sDYprzYQhvCitZFxqCTLjQxwvGGRk8LodvRrvvjsIrdq6zu_79xXhpOfCmKS9Co8q610IHspTKkZqwK4G7GrAro7Y-5ub8aYCgJM-YwSljNNfAWR7pA</addsrcrecordid><sourcetype>Open Website</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2526964483</pqid></control><display><type>article</type><title>Capacitor Reused Gate Driver for Compact In-Cell Touch Displays</title><source>IEEE Open Access Journals</source><creator>Shen, Shuai ; Liao, Congwei ; Yang, Jiwen ; Jiao, Hailong ; Zhang, Shengdong</creator><creatorcontrib>Shen, Shuai ; Liao, Congwei ; Yang, Jiwen ; Jiao, Hailong ; Zhang, Shengdong</creatorcontrib><description><![CDATA[A thin-film transistor (TFT) integrated gate driver is proposed for compact in-cell touch display, where one capacitor is reused for both turning on low-level maintaining transistors via voltage coupling and maintaining the re-start charge during the touch sensing period. The gate terminal of buffer transistor is thus free of electrical stress during touch sensing period, and can be re-charged for the subsequent re-start period, leading to minimal variations in the transient response. With the capacitor reusing scheme and a capacitor stacking structure, the area of the single stage gate driver is decreased to <inline-formula> <tex-math notation="LaTeX">645\,\,\mu \text{m}\,\,\times 210\,\,\mu \text{m} </tex-math></inline-formula>. The fabricated a-Si TFT gate driver with 8 cascaded stages shows that the rising and falling time variations among re-start and normal gate driver stages are less than <inline-formula> <tex-math notation="LaTeX">1~\mu \text{s} </tex-math></inline-formula>. Versatile touch sensing modes and bidirectional scanning functions are verified.]]></description><identifier>ISSN: 2168-6734</identifier><identifier>EISSN: 2168-6734</identifier><identifier>DOI: 10.1109/JEDS.2021.3077141</identifier><identifier>CODEN: IJEDAC</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>bidirectional scanning ; Capacitor reusing ; Capacitors ; display ; Driver stages ; Electrodes ; gate driver ; Gate drivers ; in-cell touch ; Logic gates ; Semiconductor devices ; Sensors ; Thin film transistors ; Touch ; Transient response ; Transistors</subject><ispartof>IEEE journal of the Electron Devices Society, 2021, Vol.9, p.533-538</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c435t-566b322360c1fb7671bfe7c53518628cbb219359e1cb82dba094082a0eaea70e3</citedby><cites>FETCH-LOGICAL-c435t-566b322360c1fb7671bfe7c53518628cbb219359e1cb82dba094082a0eaea70e3</cites><orcidid>0000-0002-2815-6168 ; 0000-0003-3888-4975 ; 0000-0002-1815-8661</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9420745$$EHTML$$P50$$Gieee$$Hfree_for_read</linktohtml><link.rule.ids>314,777,781,4010,27614,27904,27905,27906,54914</link.rule.ids></links><search><creatorcontrib>Shen, Shuai</creatorcontrib><creatorcontrib>Liao, Congwei</creatorcontrib><creatorcontrib>Yang, Jiwen</creatorcontrib><creatorcontrib>Jiao, Hailong</creatorcontrib><creatorcontrib>Zhang, Shengdong</creatorcontrib><title>Capacitor Reused Gate Driver for Compact In-Cell Touch Displays</title><title>IEEE journal of the Electron Devices Society</title><addtitle>JEDS</addtitle><description><![CDATA[A thin-film transistor (TFT) integrated gate driver is proposed for compact in-cell touch display, where one capacitor is reused for both turning on low-level maintaining transistors via voltage coupling and maintaining the re-start charge during the touch sensing period. The gate terminal of buffer transistor is thus free of electrical stress during touch sensing period, and can be re-charged for the subsequent re-start period, leading to minimal variations in the transient response. With the capacitor reusing scheme and a capacitor stacking structure, the area of the single stage gate driver is decreased to <inline-formula> <tex-math notation="LaTeX">645\,\,\mu \text{m}\,\,\times 210\,\,\mu \text{m} </tex-math></inline-formula>. The fabricated a-Si TFT gate driver with 8 cascaded stages shows that the rising and falling time variations among re-start and normal gate driver stages are less than <inline-formula> <tex-math notation="LaTeX">1~\mu \text{s} </tex-math></inline-formula>. Versatile touch sensing modes and bidirectional scanning functions are verified.]]></description><subject>bidirectional scanning</subject><subject>Capacitor reusing</subject><subject>Capacitors</subject><subject>display</subject><subject>Driver stages</subject><subject>Electrodes</subject><subject>gate driver</subject><subject>Gate drivers</subject><subject>in-cell touch</subject><subject>Logic gates</subject><subject>Semiconductor devices</subject><subject>Sensors</subject><subject>Thin film transistors</subject><subject>Touch</subject><subject>Transient response</subject><subject>Transistors</subject><issn>2168-6734</issn><issn>2168-6734</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>DOA</sourceid><recordid>eNpNkE9Lw0AQxYMoWGo_gHgJeE7d_9mcRFKtlYKg9bzsbiaaknbjbiL025uYUpzLDMOb94ZfFF1jNMcYZXcvj4v3OUEEzylKU8zwWTQhWMhEpJSd_5svo1kIW9SXxCITYhLd57rRtmqdj9-gC1DES91CvPDVD_i47Ne52_WKNl7tkxzqOt64zn7Fiyo0tT6Eq-ii1HWA2bFPo4-nx03-nKxfl6v8YZ1YRnmbcCEMJYQKZHFpUpFiU0JqOeVYCiKtMQRnlGeArZGkMBplDEmiEWjQKQI6jVajb-H0VjW-2ml_UE5X6m_h_KfSvq1sDYprzYQhvCitZFxqCTLjQxwvGGRk8LodvRrvvjsIrdq6zu_79xXhpOfCmKS9Co8q610IHspTKkZqwK4G7GrAro7Y-5ub8aYCgJM-YwSljNNfAWR7pA</recordid><startdate>2021</startdate><enddate>2021</enddate><creator>Shen, Shuai</creator><creator>Liao, Congwei</creator><creator>Yang, Jiwen</creator><creator>Jiao, Hailong</creator><creator>Zhang, Shengdong</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>ESBDL</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0002-2815-6168</orcidid><orcidid>https://orcid.org/0000-0003-3888-4975</orcidid><orcidid>https://orcid.org/0000-0002-1815-8661</orcidid></search><sort><creationdate>2021</creationdate><title>Capacitor Reused Gate Driver for Compact In-Cell Touch Displays</title><author>Shen, Shuai ; Liao, Congwei ; Yang, Jiwen ; Jiao, Hailong ; Zhang, Shengdong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c435t-566b322360c1fb7671bfe7c53518628cbb219359e1cb82dba094082a0eaea70e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>bidirectional scanning</topic><topic>Capacitor reusing</topic><topic>Capacitors</topic><topic>display</topic><topic>Driver stages</topic><topic>Electrodes</topic><topic>gate driver</topic><topic>Gate drivers</topic><topic>in-cell touch</topic><topic>Logic gates</topic><topic>Semiconductor devices</topic><topic>Sensors</topic><topic>Thin film transistors</topic><topic>Touch</topic><topic>Transient response</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shen, Shuai</creatorcontrib><creatorcontrib>Liao, Congwei</creatorcontrib><creatorcontrib>Yang, Jiwen</creatorcontrib><creatorcontrib>Jiao, Hailong</creatorcontrib><creatorcontrib>Zhang, Shengdong</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE Open Access Journals</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Xplore (Online service)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>IEEE journal of the Electron Devices Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shen, Shuai</au><au>Liao, Congwei</au><au>Yang, Jiwen</au><au>Jiao, Hailong</au><au>Zhang, Shengdong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Capacitor Reused Gate Driver for Compact In-Cell Touch Displays</atitle><jtitle>IEEE journal of the Electron Devices Society</jtitle><stitle>JEDS</stitle><date>2021</date><risdate>2021</risdate><volume>9</volume><spage>533</spage><epage>538</epage><pages>533-538</pages><issn>2168-6734</issn><eissn>2168-6734</eissn><coden>IJEDAC</coden><abstract><![CDATA[A thin-film transistor (TFT) integrated gate driver is proposed for compact in-cell touch display, where one capacitor is reused for both turning on low-level maintaining transistors via voltage coupling and maintaining the re-start charge during the touch sensing period. The gate terminal of buffer transistor is thus free of electrical stress during touch sensing period, and can be re-charged for the subsequent re-start period, leading to minimal variations in the transient response. With the capacitor reusing scheme and a capacitor stacking structure, the area of the single stage gate driver is decreased to <inline-formula> <tex-math notation="LaTeX">645\,\,\mu \text{m}\,\,\times 210\,\,\mu \text{m} </tex-math></inline-formula>. The fabricated a-Si TFT gate driver with 8 cascaded stages shows that the rising and falling time variations among re-start and normal gate driver stages are less than <inline-formula> <tex-math notation="LaTeX">1~\mu \text{s} </tex-math></inline-formula>. Versatile touch sensing modes and bidirectional scanning functions are verified.]]></abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JEDS.2021.3077141</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-2815-6168</orcidid><orcidid>https://orcid.org/0000-0003-3888-4975</orcidid><orcidid>https://orcid.org/0000-0002-1815-8661</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | bidirectional scanning Capacitor reusing Capacitors display Driver stages Electrodes gate driver Gate drivers in-cell touch Logic gates Semiconductor devices Sensors Thin film transistors Touch Transient response Transistors |
title | Capacitor Reused Gate Driver for Compact In-Cell Touch Displays |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T03%3A33%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_doaj_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Capacitor%20Reused%20Gate%20Driver%20for%20Compact%20In-Cell%20Touch%20Displays&rft.jtitle=IEEE%20journal%20of%20the%20Electron%20Devices%20Society&rft.au=Shen,%20Shuai&rft.date=2021&rft.volume=9&rft.spage=533&rft.epage=538&rft.pages=533-538&rft.issn=2168-6734&rft.eissn=2168-6734&rft.coden=IJEDAC&rft_id=info:doi/10.1109/JEDS.2021.3077141&rft_dat=%3Cproquest_doaj_%3E2526964483%3C/proquest_doaj_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c435t-566b322360c1fb7671bfe7c53518628cbb219359e1cb82dba094082a0eaea70e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2526964483&rft_id=info:pmid/&rft_ieee_id=9420745&rfr_iscdi=true |