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Electroluminescence and current-voltage measurements of single-(In,Ga)N/GaN-nanowire light-emitting diodes in a nanowire ensemble

We present the combined analysis of electroluminescence (EL) and current-voltage ( - ) behavior of single, freestanding (In,Ga)N/GaN nanowire (NW) light-emitting diodes (LEDs) in an unprocessed, self-assembled ensemble grown by molecular beam epitaxy. The data were acquired in a scanning electron mi...

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Bibliographic Details
Published in:Beilstein journal of nanotechnology 2019, Vol.10 (1), p.1177-1187
Main Authors: van Treeck, David, Ledig, Johannes, Scholz, Gregor, Lähnemann, Jonas, Musolino, Mattia, Tahraoui, Abbes, Brandt, Oliver, Waag, Andreas, Riechert, Henning, Geelhaar, Lutz
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Language:English
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Summary:We present the combined analysis of electroluminescence (EL) and current-voltage ( - ) behavior of single, freestanding (In,Ga)N/GaN nanowire (NW) light-emitting diodes (LEDs) in an unprocessed, self-assembled ensemble grown by molecular beam epitaxy. The data were acquired in a scanning electron microscope equipped with a micromanipulator and a luminescence detection system. Single NW spectra consist of emission lines originating from different quantum wells, and the width of the spectra increases with decreasing peak emission energy. The corresponding - characteristics are described well by a modified Shockley equation. The key advantage of this measurement approach is the possibility to correlate the EL intensity of a single-NW LED with the actual current density in this NW. This way, the external quantum efficiency (EQE) can be investigated as a function of the current in a single-NW LED. The comparison of the EQE characteristic of single NWs and the ensemble device allows for a quite accurate determination of the actual number of emitting NWs in the working ensemble LED and the respective current densities in its individual NWs. This information is decisive for a meaningful and comprehensive characterization of a NW ensemble device, rendering the measurement approach employed here a very powerful analysis tool.
ISSN:2190-4286
2190-4286
DOI:10.3762/BJNANO.10.117