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Self‐Formation of SnCl2 Passivation Layer on SnO2 Electron‐Transport Layer in Chloride–Iodide‐Based Perovskite Solar Cell

The phenomenon of the self‐formation of a passivation layer at the interface of the perovskite/electron‐transport layer (ETL) is observed. FA0.6MA0.4PbI3−xClx perovskite thin film is deposited on a SnO2 nanoparticle thin‐film ETL. It is observed from the depth‐resolved spectroscopy that the Sn2+ ion...

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Bibliographic Details
Published in:Advanced energy and sustainability research 2024-07, Vol.5 (7), p.n/a
Main Authors: Howlader, Ashraful Hossain, Dipta, Shahriyar Safat, Tarique, Walia Binte, Qi, Yulun, Pratik, Ayush, Yin, Yao, Hossain, Md Anower, Uddin, Ashraf
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Language:English
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Summary:The phenomenon of the self‐formation of a passivation layer at the interface of the perovskite/electron‐transport layer (ETL) is observed. FA0.6MA0.4PbI3−xClx perovskite thin film is deposited on a SnO2 nanoparticle thin‐film ETL. It is observed from the depth‐resolved spectroscopy that the Sn2+ ion migrates toward the perovskite layer within the ETL. At the same time, Cl− ion also migrates toward ETL within the perovskite layer. This unique ion migration phenomenon leads us to conclude that a passivating SnCl2 layer is formed at the perovskite/ETL interface. It is found that this SnCl2 layer at the interface works as a passivation layer like Al2O3. There is a significant effect of this self‐formed passivating layer behind the improvement of the device's efficiency and stability. It is believed that this SnCl2 passivation layer helps to reduce the recombination loss at the interface and boosts the performance of the perovskite solar cell (PSC). The perovskite/hole‐transport layer is also passivated with octylammonium bromide. Finally, the PSC offers a photoconversion efficiency (PCE) of 20.81% under 1 sun and AM1.5 G condition. Again, it maintains more than 80% of PCE under open‐air room conditions, white light emitting diode, and 85 °C continuous heating for more than 12 h without encapsulation. Self‐formation of the interfacial passivation layer is observed in the junction of the SnO2 electron‐transport layer and chloride–iodide perovskite active layer. The self‐formed SnCl2 layer reduces the back‐recombination of photogenerated electrons and passivates the interfacial defects. Thus, the passivation layer has a significant effect on the improvement of efficiency and stability of the perovskite solar cell.
ISSN:2699-9412
2699-9412
DOI:10.1002/aesr.202400030