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Estimation of phonon relaxation time for silicon by means of using the velocity autocorrelation function of atoms in molecular dynamics

Results of the ab initio molecular dynamics calculations of silicon crystals are presented by means of analysis of the velocity autocorrelation function and determination of mean phonon relaxation time. The mean phonon relaxation time is crucial for prediction of the phonon-associated coefficient of...

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Published in:Bulletin of the Polish Academy of Sciences. Technical sciences 2019-01, Vol.67 (3), p.651-656
Main Authors: Andriyevsky, B., Maliński, M., Buryło, Ł., Stadnyk, V.Y., Romanyuk, M.O., Piekarski, J., Andriyevska, L.
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container_title Bulletin of the Polish Academy of Sciences. Technical sciences
container_volume 67
creator Andriyevsky, B.
Maliński, M.
Buryło, Ł.
Stadnyk, V.Y.
Romanyuk, M.O.
Piekarski, J.
Andriyevska, L.
description Results of the ab initio molecular dynamics calculations of silicon crystals are presented by means of analysis of the velocity autocorrelation function and determination of mean phonon relaxation time. The mean phonon relaxation time is crucial for prediction of the phonon-associated coefficient of thermal conductivity of materials. A clear correlation between the velocity autocorrelation function relaxation time and the coefficient of thermal diffusivity has been found. The analysis of the results obtained has indicated a decrease of the velocity autocorrelation function relaxation time t with increase of temperature. The method proposed may be used to estimate the coefficient of ther-mal diffusivity and thermal conductivity of the materials based on silicon and of other wide-bandgap semiconductors. The correlation between kinetic energy fluctuations and relaxation time of the velocity autocorrelation function has been calculated with the relatively high coefficient of determination R2 = 0.9396. The correlation obtained and the corresponding approach substantiate the use of kinetic energy fluctuations for the calculation of values related to heat conductivity in silicon-based semiconductors (coefficients of thermal conductivity and diffusivity).
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fullrecord <record><control><sourceid>proquest_doaj_</sourceid><recordid>TN_cdi_doaj_primary_oai_doaj_org_article_619d88ce4cba44e9842f4ae5cc467833</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><doaj_id>oai_doaj_org_article_619d88ce4cba44e9842f4ae5cc467833</doaj_id><sourcerecordid>2652078286</sourcerecordid><originalsourceid>FETCH-LOGICAL-c338t-93efeadd13731f14e913e988bc6819f0ac35dfe6474d9310ce44549674a7dcc23</originalsourceid><addsrcrecordid>eNpNkcFu3CAQhq2qlRoleYJekHLeLTAYw7GK0nSlSLkkZzSLIWFlmw3gqvsEee2w66TKXBj9_PMN6G-aH4yuuRC8_bndYy55zSnTa8a1lPClOeNA6Ypp1n391H9vLnPe0VoArJNw1rze5BJGLCFOJHqyf45T7ZIb8N8i1ltHfEwkhyHYKmwPZHQ45aN9zmF6IuXZkb9uiDaUA8G5RBvTkXCa9_NkP-hY4phJmMgYB2fnARPpDxOOweaL5pvHIbvL9_O8efx983D9Z3V3f7u5_nW3sgCqrDQ477DvGXTAPBNOM3Baqa2VimlP0ULbeydFJ3oNjFonRCu07AR2vbUczpvNwu0j7sw-1b-ng4kYzEmI6clgKsEOzkime6UqwW5R1E1KcC_QtdYK2SmAyrpaWPsUX2aXi9nFOU31-YbLltNOcSWrCxaXTTHn5Pz_rYyaU4BmCdAcAzRLgPAG2ESSkA</addsrcrecordid><sourcetype>Open Website</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2652078286</pqid></control><display><type>article</type><title>Estimation of phonon relaxation time for silicon by means of using the velocity autocorrelation function of atoms in molecular dynamics</title><source>Publicly Available Content Database</source><creator>Andriyevsky, B. ; Maliński, M. ; Buryło, Ł. ; Stadnyk, V.Y. ; Romanyuk, M.O. ; Piekarski, J. ; Andriyevska, L.</creator><creatorcontrib>Andriyevsky, B. ; Maliński, M. ; Buryło, Ł. ; Stadnyk, V.Y. ; Romanyuk, M.O. ; Piekarski, J. ; Andriyevska, L.</creatorcontrib><description>Results of the ab initio molecular dynamics calculations of silicon crystals are presented by means of analysis of the velocity autocorrelation function and determination of mean phonon relaxation time. The mean phonon relaxation time is crucial for prediction of the phonon-associated coefficient of thermal conductivity of materials. A clear correlation between the velocity autocorrelation function relaxation time and the coefficient of thermal diffusivity has been found. The analysis of the results obtained has indicated a decrease of the velocity autocorrelation function relaxation time t with increase of temperature. The method proposed may be used to estimate the coefficient of ther-mal diffusivity and thermal conductivity of the materials based on silicon and of other wide-bandgap semiconductors. The correlation between kinetic energy fluctuations and relaxation time of the velocity autocorrelation function has been calculated with the relatively high coefficient of determination R2 = 0.9396. The correlation obtained and the corresponding approach substantiate the use of kinetic energy fluctuations for the calculation of values related to heat conductivity in silicon-based semiconductors (coefficients of thermal conductivity and diffusivity).</description><identifier>ISSN: 2300-1917</identifier><identifier>ISSN: 0239-7528</identifier><identifier>EISSN: 2300-1917</identifier><identifier>DOI: 10.24425/bpasts.2019.129663</identifier><language>eng</language><publisher>Warsaw: Polish Academy of Sciences</publisher><subject>Autocorrelation functions ; coefficient of thermal diffusivity ; Coefficients ; Diffusivity ; Heat conductivity ; Heat transfer ; Kinetic energy ; Mathematical analysis ; Molecular dynamics ; Phonons ; Relaxation time ; relaxation time of the velocity autocorrelation function ; Semiconductors ; Silicon ; Thermal conductivity ; Thermal diffusivity ; Velocity ; Wide bandgap semiconductors</subject><ispartof>Bulletin of the Polish Academy of Sciences. Technical sciences, 2019-01, Vol.67 (3), p.651-656</ispartof><rights>2019. This work is licensed under https://creativecommons.org/licenses/by-sa/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/2652078286?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,25753,27924,27925,37012,44590</link.rule.ids></links><search><creatorcontrib>Andriyevsky, B.</creatorcontrib><creatorcontrib>Maliński, M.</creatorcontrib><creatorcontrib>Buryło, Ł.</creatorcontrib><creatorcontrib>Stadnyk, V.Y.</creatorcontrib><creatorcontrib>Romanyuk, M.O.</creatorcontrib><creatorcontrib>Piekarski, J.</creatorcontrib><creatorcontrib>Andriyevska, L.</creatorcontrib><title>Estimation of phonon relaxation time for silicon by means of using the velocity autocorrelation function of atoms in molecular dynamics</title><title>Bulletin of the Polish Academy of Sciences. Technical sciences</title><description>Results of the ab initio molecular dynamics calculations of silicon crystals are presented by means of analysis of the velocity autocorrelation function and determination of mean phonon relaxation time. The mean phonon relaxation time is crucial for prediction of the phonon-associated coefficient of thermal conductivity of materials. A clear correlation between the velocity autocorrelation function relaxation time and the coefficient of thermal diffusivity has been found. The analysis of the results obtained has indicated a decrease of the velocity autocorrelation function relaxation time t with increase of temperature. The method proposed may be used to estimate the coefficient of ther-mal diffusivity and thermal conductivity of the materials based on silicon and of other wide-bandgap semiconductors. The correlation between kinetic energy fluctuations and relaxation time of the velocity autocorrelation function has been calculated with the relatively high coefficient of determination R2 = 0.9396. The correlation obtained and the corresponding approach substantiate the use of kinetic energy fluctuations for the calculation of values related to heat conductivity in silicon-based semiconductors (coefficients of thermal conductivity and diffusivity).</description><subject>Autocorrelation functions</subject><subject>coefficient of thermal diffusivity</subject><subject>Coefficients</subject><subject>Diffusivity</subject><subject>Heat conductivity</subject><subject>Heat transfer</subject><subject>Kinetic energy</subject><subject>Mathematical analysis</subject><subject>Molecular dynamics</subject><subject>Phonons</subject><subject>Relaxation time</subject><subject>relaxation time of the velocity autocorrelation function</subject><subject>Semiconductors</subject><subject>Silicon</subject><subject>Thermal conductivity</subject><subject>Thermal diffusivity</subject><subject>Velocity</subject><subject>Wide bandgap semiconductors</subject><issn>2300-1917</issn><issn>0239-7528</issn><issn>2300-1917</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><sourceid>DOA</sourceid><recordid>eNpNkcFu3CAQhq2qlRoleYJekHLeLTAYw7GK0nSlSLkkZzSLIWFlmw3gqvsEee2w66TKXBj9_PMN6G-aH4yuuRC8_bndYy55zSnTa8a1lPClOeNA6Ypp1n391H9vLnPe0VoArJNw1rze5BJGLCFOJHqyf45T7ZIb8N8i1ltHfEwkhyHYKmwPZHQ45aN9zmF6IuXZkb9uiDaUA8G5RBvTkXCa9_NkP-hY4phJmMgYB2fnARPpDxOOweaL5pvHIbvL9_O8efx983D9Z3V3f7u5_nW3sgCqrDQ477DvGXTAPBNOM3Baqa2VimlP0ULbeydFJ3oNjFonRCu07AR2vbUczpvNwu0j7sw-1b-ng4kYzEmI6clgKsEOzkime6UqwW5R1E1KcC_QtdYK2SmAyrpaWPsUX2aXi9nFOU31-YbLltNOcSWrCxaXTTHn5Pz_rYyaU4BmCdAcAzRLgPAG2ESSkA</recordid><startdate>20190101</startdate><enddate>20190101</enddate><creator>Andriyevsky, B.</creator><creator>Maliński, M.</creator><creator>Buryło, Ł.</creator><creator>Stadnyk, V.Y.</creator><creator>Romanyuk, M.O.</creator><creator>Piekarski, J.</creator><creator>Andriyevska, L.</creator><general>Polish Academy of Sciences</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K7-</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>DOA</scope></search><sort><creationdate>20190101</creationdate><title>Estimation of phonon relaxation time for silicon by means of using the velocity autocorrelation function of atoms in molecular dynamics</title><author>Andriyevsky, B. ; Maliński, M. ; Buryło, Ł. ; Stadnyk, V.Y. ; Romanyuk, M.O. ; Piekarski, J. ; Andriyevska, L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c338t-93efeadd13731f14e913e988bc6819f0ac35dfe6474d9310ce44549674a7dcc23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Autocorrelation functions</topic><topic>coefficient of thermal diffusivity</topic><topic>Coefficients</topic><topic>Diffusivity</topic><topic>Heat conductivity</topic><topic>Heat transfer</topic><topic>Kinetic energy</topic><topic>Mathematical analysis</topic><topic>Molecular dynamics</topic><topic>Phonons</topic><topic>Relaxation time</topic><topic>relaxation time of the velocity autocorrelation function</topic><topic>Semiconductors</topic><topic>Silicon</topic><topic>Thermal conductivity</topic><topic>Thermal diffusivity</topic><topic>Velocity</topic><topic>Wide bandgap semiconductors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Andriyevsky, B.</creatorcontrib><creatorcontrib>Maliński, M.</creatorcontrib><creatorcontrib>Buryło, Ł.</creatorcontrib><creatorcontrib>Stadnyk, V.Y.</creatorcontrib><creatorcontrib>Romanyuk, M.O.</creatorcontrib><creatorcontrib>Piekarski, J.</creatorcontrib><creatorcontrib>Andriyevska, L.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer science database</collection><collection>https://resources.nclive.org/materials</collection><collection>ProQuest Engineering Collection</collection><collection>ProQuest Engineering Database</collection><collection>ProQuest advanced technologies &amp; aerospace journals</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials science collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering collection</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>Bulletin of the Polish Academy of Sciences. Technical sciences</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Andriyevsky, B.</au><au>Maliński, M.</au><au>Buryło, Ł.</au><au>Stadnyk, V.Y.</au><au>Romanyuk, M.O.</au><au>Piekarski, J.</au><au>Andriyevska, L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Estimation of phonon relaxation time for silicon by means of using the velocity autocorrelation function of atoms in molecular dynamics</atitle><jtitle>Bulletin of the Polish Academy of Sciences. Technical sciences</jtitle><date>2019-01-01</date><risdate>2019</risdate><volume>67</volume><issue>3</issue><spage>651</spage><epage>656</epage><pages>651-656</pages><issn>2300-1917</issn><issn>0239-7528</issn><eissn>2300-1917</eissn><abstract>Results of the ab initio molecular dynamics calculations of silicon crystals are presented by means of analysis of the velocity autocorrelation function and determination of mean phonon relaxation time. The mean phonon relaxation time is crucial for prediction of the phonon-associated coefficient of thermal conductivity of materials. A clear correlation between the velocity autocorrelation function relaxation time and the coefficient of thermal diffusivity has been found. The analysis of the results obtained has indicated a decrease of the velocity autocorrelation function relaxation time t with increase of temperature. The method proposed may be used to estimate the coefficient of ther-mal diffusivity and thermal conductivity of the materials based on silicon and of other wide-bandgap semiconductors. The correlation between kinetic energy fluctuations and relaxation time of the velocity autocorrelation function has been calculated with the relatively high coefficient of determination R2 = 0.9396. The correlation obtained and the corresponding approach substantiate the use of kinetic energy fluctuations for the calculation of values related to heat conductivity in silicon-based semiconductors (coefficients of thermal conductivity and diffusivity).</abstract><cop>Warsaw</cop><pub>Polish Academy of Sciences</pub><doi>10.24425/bpasts.2019.129663</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record>
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0239-7528
2300-1917
language eng
recordid cdi_doaj_primary_oai_doaj_org_article_619d88ce4cba44e9842f4ae5cc467833
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subjects Autocorrelation functions
coefficient of thermal diffusivity
Coefficients
Diffusivity
Heat conductivity
Heat transfer
Kinetic energy
Mathematical analysis
Molecular dynamics
Phonons
Relaxation time
relaxation time of the velocity autocorrelation function
Semiconductors
Silicon
Thermal conductivity
Thermal diffusivity
Velocity
Wide bandgap semiconductors
title Estimation of phonon relaxation time for silicon by means of using the velocity autocorrelation function of atoms in molecular dynamics
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T05%3A52%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_doaj_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Estimation%20of%20phonon%20relaxation%20time%20for%20silicon%20by%20means%20of%20using%20the%20velocity%20autocorrelation%20function%20of%20atoms%20in%20molecular%20dynamics&rft.jtitle=Bulletin%20of%20the%20Polish%20Academy%20of%20Sciences.%20Technical%20sciences&rft.au=Andriyevsky,%20B.&rft.date=2019-01-01&rft.volume=67&rft.issue=3&rft.spage=651&rft.epage=656&rft.pages=651-656&rft.issn=2300-1917&rft.eissn=2300-1917&rft_id=info:doi/10.24425/bpasts.2019.129663&rft_dat=%3Cproquest_doaj_%3E2652078286%3C/proquest_doaj_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c338t-93efeadd13731f14e913e988bc6819f0ac35dfe6474d9310ce44549674a7dcc23%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2652078286&rft_id=info:pmid/&rfr_iscdi=true