The Impact of a Taper Impedance Transformation on the TRL De-Embedding Error

This work originates from the realization that, in a transformed impedance thru-reflect-line (TRL) calibration, the sensitivity to random measurement errors is affected by impedance discrepancies between the impedance transformer and the device-under-test (DUT). Through a thorough exploration that i...

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Bibliographic Details
Published in:IEEE journal of microwaves 2024-07, Vol.4 (3), p.389-403
Main Authors: Louro, Joao, Nunes, Luis C., Barradas, Filipe M., Cabral, Pedro M., Pedro, Jose C.
Format: Article
Language:English
Subjects:
Calibration
de-embedding
Impedance
Impedance measurement
measurement error
Measurement errors
Measurement uncertainty
Simulation
taper
Transmission line measurements
TRL calibration
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Summary:This work originates from the realization that, in a transformed impedance thru-reflect-line (TRL) calibration, the sensitivity to random measurement errors is affected by impedance discrepancies between the impedance transformer and the device-under-test (DUT). Through a thorough exploration that includes theoretical analysis, simulations and TRL measurements, this study establishes that the accuracy of de-embedding operations on a transformed impedance medium is intricately tied to the difference between the Thevenin impedance seen from the DUT-side of the launcher and the DUT impedance. A noteworthy finding is that minimizing this difference enhances the resilience of the de-embedding process against random measurement errors, being advantageous for precision modeling techniques, and demonstrating the importance of considering those concepts when designing an access structure to a DUT.
ISSN:2692-8388
2692-8388
DOI:10.1109/JMW.2024.3405018