Dose rate effects on array CCDs exposed by Co-60 γ rays induce saturation output degradation and annealing tests

The experimental tests of dose rate and annealing effects on array charge-coupled devices (CCDs) are presented. The saturation output voltage (VS) versus the total dose at the dose rates of 0.01, 0.1, 1.0, 10.0 and 50 rad(Si)/s are compared. Annealing tests are performed to eliminate the time-depend...

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Bibliographic Details
Published in:AIP advances 2015-10, Vol.5 (10), p.107134-107134-8
Main Authors: Wang, Zujun, Chen, Wei, He, Baoping, Yao, Zhibin, Xiao, Zhigang, Sheng, Jiangkun, Liu, Minbo
Format: Article
Language:English
Subjects:
ANNEALING
CHARGE-COUPLED DEVICES
COBALT 60
COMPARATIVE EVALUATIONS
Degradation
Dosage
DOSE RATES
ELECTRIC POTENTIAL
GAMMA RADIATION
Gamma rays
IRRADIATION
MATERIALS SCIENCE
PHYSICAL RADIATION EFFECTS
RADIATION DOSES
Saturation
TIME DEPENDENCE
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Summary:The experimental tests of dose rate and annealing effects on array charge-coupled devices (CCDs) are presented. The saturation output voltage (VS) versus the total dose at the dose rates of 0.01, 0.1, 1.0, 10.0 and 50 rad(Si)/s are compared. Annealing tests are performed to eliminate the time-dependent effects. The VS degradation levels depend on the dose rates. The VS degradation mechanism induced by dose rate and annealing effects is analyzed. The VS at 20 krad(Si) with the dose rate of 0.03 rad(Si)/s are supplemented to assure the degradation curves between the dose rates of 0.1 and 0.01 rad(Si)/s. The CCDs are divided into two groups, with one group biased and the other unbiased during 60Co γ radiation. The VS degradation levels of the biased CCDs during radiation are more severe than that of the unbiased CCDs.
ISSN:2158-3226
2158-3226
DOI:10.1063/1.4934931