Hole mobility enhancement of MEH-PPV film by heat treatment at Tg

The hole mobility of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) film was measured using the time-of-flight method. The hole mobility was enhanced 4-fold after annealing at around the glass transition temperature (Tg). Optical, atomic force, and Kelvin force microscopies, a...

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Bibliographic Details
Published in:AIP advances 2015-12, Vol.5 (12), p.127130-127130-7
Main Authors: Kajiya Daisuke, Koganezawa Tomoyuki
Format: Article
Language:English
Subjects:
Annealing
Atomic force microscopy
Glass transition temperature
Heat treatment
Hole mobility
Polyphenylene vinylene
X-ray diffraction
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Summary:The hole mobility of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) film was measured using the time-of-flight method. The hole mobility was enhanced 4-fold after annealing at around the glass transition temperature (Tg). Optical, atomic force, and Kelvin force microscopies, and grazing-incidence X-ray diffraction measurements indicate the enhancement can be attributed to a homogeneous film structure, a homogeneous Fermi level energy, and a face-on oriented structure, all of which were established by annealing at Tg.
ISSN:2158-3226
2158-3226
DOI:10.1063/1.4939135