Two dynamic modes to streamline challenging atomic force microscopy measurements

The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scanning parameters. When using the most common scanning method – semicontact amplitude modulation (tapping) mode, the choice of scanning parameters is quite complicated, since...

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Bibliographic Details
Published in:Beilstein journal of nanotechnology 2021-11, Vol.12 (1), p.1226-1236
Main Authors: Temiryazev, Alexei G, Krayev, Andrey V, Temiryazeva, Marina P
Format: Article
Language:English
Subjects:
Amplitude modulation
Atomic force microscopy
dissipation mode
Full Research Paper
High aspect ratio
Image quality
Mechanical properties
Microscopy
Nanoscience
Nanotechnology
Parameters
scanning probe microscopy
Topography
vertical mode
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Summary:The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scanning parameters. When using the most common scanning method – semicontact amplitude modulation (tapping) mode, the choice of scanning parameters is quite complicated, since it requires taking into account many factors and finding the optimal balance between them. A researcher’s task can be significantly simplified by introducing new scanning techniques. Two such techniques are described: vertical and dissipation modes. Significantly simplified and formalized choice of the imaging parameters in these modes allows addressing a wide range of formerly challenging tasks – from scanning rough samples with high aspect ratio features to molecular resolution imaging.
ISSN:2190-4286
2190-4286
DOI:10.3762/bjnano.12.90