Novel combined Shewhart-CUmulative EWMA-SUM mean charts without- and with measurement error

• Published in: Measurement and control (London) 2024-12, Vol.57 (10), p.1480-1498
• Main Authors: Munir, Tahir, Alqahtani, Fahad M., Alrashidi, Afaf, Rahman, Abdu R, Cheema, Salman Arif, Li, Yi
• Format: Article
• Language: English
• Subjects: Control charts; Control methods; Error analysis; Error detection; Monte Carlo simulation; Quality control
• ISSN: 0020-2940; 2051-8730
• DOI: 10.1177/00202940241227814

The precision of process monitoring often encounters challenges in determining the exact shift size. Therefore, combined control charts have gained considerable attention because of their excellent speed to detect simultaneously small-to-moderate and large-size shifts. The effectiveness of the applied quality control methods strongly depends on the performance of the measurement system. Measurement error presence contributes significantly negatively toward the performance of the usual control charting schemes. This article proposes novel two-sided combined Shewhart-Cumulative EWMA-sum (Shewhart-CUESUM) control charts designed to efficiently monitor the mean of normally distributed processes. In addition, to address measurement errors, the M-Shewhart-CUESUM chart is proposed, incorporating an additive measurement error model. Evaluation of the charts through Monte-Carlo simulations, considering metrics such as average run length (ARL), extra quadratic loss, relative ARL, and performance comparison index. It is found that the combined Shewhart-CUESUM outperforms than CUESUM chart. The results show that the presence of measurement errors can significantly diminish the charts’ performance, which can be mitigated by utilizing a multiple measurements scheme. Among the different well-established combined charts examined, the M-Shewhart-CUESUM chart shows considerably more sensitive to detecting simultaneously detect small and large size shifts. To employ simulated datasets to illustrate the impact of measurement errors and demonstrate the implications of the proposed charts on process mean shifts.