Quintic refractive index profile-based funnel-shaped silicon antireflective structures for enhanced photodetector performance

• Published in: Scientific reports 2024-05, Vol.14 (1), p.10410-10410, Article 10410
• Main Authors: Kim, Beom-Jun, Jo, Min-Seung, Yang, Jae-Soon, Chung, Myung-Kun, Kim, Sung-Ho, Yoon, Jun-Bo
• Format: Article
• Language: English
• Subjects: 639/166/987; 639/624/399; Design; Etching; Humanities and Social Sciences; multidisciplinary; Reflectance; Science; Science (multidisciplinary); Silicon; Solar cells
• ISSN: 2045-2322; 2045-2322
• DOI: 10.1038/s41598-024-61156-6

Antireflection, vital in optoelectronics devices such as solar cells and photodetectors, reduces light reflection and increases absorption. Antireflective structures (ARS), a primary method by which to realize this effect, control the refractive index (RI) profile based on their shape. The antireflection efficiency depends on the refractive index profile, with the quintic RI profile being recognized as ideal for superior antireflection. However, fabricating nano-sized structures with a desired shape, particularly in silicon with a quintic RI profile, has been a challenge. In this study, we introduce a funnel-shaped silicon (Si) ARS with a quintic RI profile. Its antireflective properties are demonstrated through reflectance measurements and by an application to a photodetector surface. Compared to the film Si and cone-shaped ARS types, which are common structures to achieve antireflection, the funnel-shaped ARS showed reflectance of 4.24% at 760 nm, whereas those of the film Si and cone-shaped ARS were 32.8% and 10.6%, respectively. Photodetectors with the funnel-shaped ARS showed responsivity of 0.077 A/W at 950 nm, which is 19.54 times higher than that with the film Si and 2.45 times higher than that with the cone-shaped ARS.