On the ionization loss spectra of high-energy channeled negatively charged particles

The ionization loss spectra of high-energy negatively charged particles which move in the planar channeling mode in a silicon crystal are studied with the use of numerical simulation. The case when the crystal thickness is on the order of the dechanneling length l d is considered. It is shown that i...

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Bibliographic Details
Published in:The European physical journal. C, Particles and fields Particles and fields, 2020-07, Vol.80 (7), p.1-6, Article 689
Main Authors: Trofymenko, S. V., Kyryllin, I. V.
Format: Article
Language:English
Subjects:
Astronomy
Astrophysics and Cosmology
Channeling
Charged particles
Computer simulation
Elementary Particles
Hadrons
Heavy Ions
Ionization
Measurement Science and Instrumentation
Nuclear Energy
Nuclear Physics
Numerical analysis
Physics
Physics and Astronomy
Quantum Field Theories
Quantum Field Theory
Regular Article - Experimental Physics
String Theory
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Summary:The ionization loss spectra of high-energy negatively charged particles which move in the planar channeling mode in a silicon crystal are studied with the use of numerical simulation. The case when the crystal thickness is on the order of the dechanneling length l d is considered. It is shown that in this case the shape of the spectrum noticeably depends on l d . The evolution of various characteristic parameters of the spectrum with the change of l d is investigated. A method of the experimental determination of l d on the basis of the measurement of the ionization loss spectrum is proposed.
ISSN:1434-6044
1434-6052
DOI:10.1140/epjc/s10052-020-8127-z