The design and testing issues of radiation tolerant microwave amplifiers implemented in the domestic GaAs pHEMT 0.5 μm process

The investigation results of the possibility of manufacturing radiation tolerant microwave amplifiers implementing in domestic GaAs D-mode pHEMT 0.5 μm process are presented in this work. The amplifier with an operating frequency range from 0.1 GHz to 3.5 GHz, gain above 15 dB, noise figure below 2....

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Bibliographic Details
Published in:ITM web of conferences 2019, Vol.30, p.10001
Main Authors: Sotskov, Denis, Kuznetsov, Alexander, Usachev, Nikolay, Elesin, Vadim, Selishchev, Ilya
Format: Article
Language:English
Subjects:
Circuits
Dosage
Frequency ranges
Linearity
Microwave amplifiers
Noise levels
Radiation effects
Recovery time
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Summary:The investigation results of the possibility of manufacturing radiation tolerant microwave amplifiers implementing in domestic GaAs D-mode pHEMT 0.5 μm process are presented in this work. The amplifier with an operating frequency range from 0.1 GHz to 3.5 GHz, gain above 15 dB, noise figure below 2.2 dB, output linearity above 17 dBm is designed, produced and measured. The characteristic property of the amplifier is a single positive supply voltage and extended frequency range up to 100 MHz provided by the external capacitor circuit. Transient radiation effects in the amplifier are investigated up to the dose rate value of 4.9·10 9 a.u./s. The recovery time does not exceed 4 μs according to the experimental results.
ISSN:2271-2097
2431-7578
2271-2097
DOI:10.1051/itmconf/20193010001