Effects of silicon dioxide as the polar dielectric on the infrared absorption spectrum of the metal-insulator-metal metasurface

Metal-insulator-metal metasurfaces have been widely used as high-performance absorbers in almost all electromagnetic spectral ranges. Their absorption spectra can be engineered by making variations in the geometry of the unit cells and/or by embedding materials with specific optical constants. Inclu...

Full description

Saved in:
Bibliographic Details
Published in:Materials research express 2023-01, Vol.10 (1), p.15801
Main Authors: Jafari, Ahmad K, Gaddy, Matthew, Ahmad, Imtiaz, Kachiraju, Satya R, Mia, M D Borhan, Ahmed, Ishtiaque, Nikishin, Sergey, Kim, Myoung-Hwan, Bernussi, Ayrton A
Format: Article
Language:English
Subjects:
Absorbers
Absorption spectra
berreman mode
epsilon-near-zero mode
Excitation
Infrared absorption
Infrared filters
Infrared reflection
Insulators
metal-insulator-metal metasurafces
Metasurfaces
mid-infrared
polar dielectrics
Silica
Silicon dioxide
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Metal-insulator-metal metasurfaces have been widely used as high-performance absorbers in almost all electromagnetic spectral ranges. Their absorption spectra can be engineered by making variations in the geometry of the unit cells and/or by embedding materials with specific optical constants. Including a polar dielectric in their structure is another approach for manipulating their absorption spectra. In this research, we have numerically and experimentally investigated the effect of using silicon dioxide ( SiO 2 ) as a polar dielectric on the absorption spectrum of a metal-insulator-metal metasurface composed of a tri-layer of Ni-SiO 2 -Ni . Our results have shown the presence of absorption peaks in the mid-infrared which are attributed to the excitation of the optical phonons in the SiO 2 spacer layer. Particularly, the excitation of the Berreman mode in the SiO 2 spacer layer was observed and its effect on the total absorption spectrum is studied. The parametric effects of the top patterned Ni layer, the incident angle, and the polarization are also investigated. This study can provide engineering capabilities for the mid-infrared absorbers and reflection filters.
ISSN:2053-1591
2053-1591
DOI:10.1088/2053-1591/acaf4c