Membrane characterization by microscopic and scattering methods: multiscale structure

• Published in: Membranes (Basel) 2011-04, Vol.1 (2), p.91-97
• Main Authors: Tamime, Rahma, Wyart, Yvan, Siozade, Laure, Baudin, Isabelle, Deumie, Carole, Glucina, Karl, Moulin, Philippe
• Format: Article
• Language: English
• Subjects: atomic force microscopy; Chemical and Process Engineering; ellipsometry; Engineering Sciences; Interferometry; membrane; Membranes; Optics; Photonic; roughness; white light interferometry
• ISSN: 2077-0375; 2077-0375
• DOI: 10.3390/membranes1020091

Several microscopic and scattering techniques at different observation scales (from atomic to macroscopic) were used to characterize both surface and bulk properties of four new flat-sheet polyethersulfone (PES) membranes (10, 30, 100 and 300 kDa) and new 100 kDa hollow fibers (PVDF). Scanning Electron Microscopy (SEM) with "in lens" detection was used to obtain information on the pore sizes of the skin layers at the atomic scale. White Light Interferometry (WLI) and Atomic Force Microscopy (AFM) using different scales (for WLI: windows: 900 × 900 µm2 and 360 × 360 µm2; number of points: 1024; for AFM: windows: 50 × 50 µm2 and 5 × 5 µm2; number of points: 512) showed that the membrane roughness increases markedly with the observation scale and that there is a continuity between the different scan sizes for the determination of the RMS roughness. High angular resolution ellipsometric measurements were used to obtain the signature of each cut-off and the origin of the scattering was identified as coming from the membrane bulk.