X-ray strain analysis in thin films enhanced by 2D detection

Performing a complete in-situ strain measurement of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two dimensional detection is shown to enable relatively fast...

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Bibliographic Details
Published in:EPJ Web of conferences 2010-01, Vol.6, p.26008
Main Authors: Brémand, Fabrice, Geandier, G., Faurie, D., Renault, P.O., Le Bourlot, C., Djemia, P., Castelnau, O., Chérif, S.M., Le Bourhis, E., Goudeau, P.
Format: Article
Language:English
Subjects:
Engineering Sciences
Mechanics
Mechanics of materials
Online Access:Get full text
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Summary:Performing a complete in-situ strain measurement of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two dimensional detection is shown to enable relatively fast and reliable X-ray strain measurements during continuous in-situ tensile testing of metallic films deposited on polyimide substrates. We show in this paper the advantages to perform this kind of measurements as compared to those with punctual detection.
ISSN:2100-014X
2100-014X
DOI:10.1051/epjconf/20100626008