Microstructure and peeling behavior of MOCVD processed oxide insulator coating before and after ion beam irradiation

•The adhesion strength of the MOCVD processed multi oxide coating (Er2O3/Y2O3/SUS) before and after 2.4 MeV Cu2+ ion beam irradiation could be easily estimated using the nano-scratch method.•The adhesion strength at 1.5 dpa Cu2+ ion beam irradiation corresponded to approximately 70% compared with th...

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Bibliographic Details
Published in:Nuclear materials and energy 2018-08, Vol.16, p.123-127
Main Authors: Hishinuma, Y., Tanaka, M., Tanaka, T., Matsuda, K., Watanabe, H., Muroga, T.
Format: Article
Language:English
Subjects:
Adhesion strength
Er2O3, MOCVD
Ion beam irradiation
Multi-layered coating
Nano-scratch method
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Summary:•The adhesion strength of the MOCVD processed multi oxide coating (Er2O3/Y2O3/SUS) before and after 2.4 MeV Cu2+ ion beam irradiation could be easily estimated using the nano-scratch method.•The adhesion strength at 1.5 dpa Cu2+ ion beam irradiation corresponded to approximately 70% compared with that of without ion beam irradiation.•The adhesion strength degradation by the Cu2+ ion irradiation was caused by the thicker and accelerated amorphous Fe-(Y)-O interlayer formation base on the displacement damage dose effect. The mechanical durability and soundness of the several oxide coating materials used as the electrical insulator and tritium permeation barrier are important design parameters on an advanced liquid breeding blanket system. We tried to investigate the adhesion strength evaluation due to the peeling behavior on the MOCVD processed multilayered oxide coating (Er2O3/Y2O3) on the stainless steel (SUS) substrate before and after Cu2+ ion beam irradiation using the nano-scratch tester. The adhesion strength of the coating material was able to estimate easily from the scratch trace and scratch stress, and the nano-scratch test was suitable method to evaluate the mechanical durability and soundness. After the Cu2+ ion beam irradiation, the adhesion strength was decreased with increasing the displacement per atom (dpa). The adhesion strength degradation by the Cu2+ ion beam irradiation was caused by the embrittlement of the thicker and amorphous Fe-(Y)-O interlayer formation between Y2O3 buffer layer and SUS substrate based on the displacement damage dose effect.
ISSN:2352-1791
2352-1791
DOI:10.1016/j.nme.2018.06.001