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Fabrication of Sio2-based microcantilevers by anisotropic chemical etching of (100) single crystal Si
The undercutting process of thermal SiO2 microcantilevers with different orientations on (100) Si wafer was studied. The silicon substrate was removed by anisotropic chemical etching with a 25 wt. % aqueous solution of TMAH or a 30 wt. % aqueous KOH solution at 80 ?C. It was found that [110] oriente...
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Published in: | Journal of the Serbian Chemical Society 2007-01, Vol.72 (11), p.1127-1138 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The undercutting process of thermal SiO2 microcantilevers with different orientations on (100) Si wafer was studied. The silicon substrate was removed by anisotropic chemical etching with a 25 wt. % aqueous solution of TMAH or a 30 wt. % aqueous KOH solution at 80 ?C. It was found that [110] oriented cantilevers were undercutting frontally along the length and [100] oriented cantilevers experience undercutting along the width of the cantilever, which is a less time consuming process. The studies showed that the [100] orientation of SiO2 microbridges enables theirs fabrication on a (100) oriented Si substrate.
Izucavana je realizacija mikrogredica od termicki deponovanog SiO2 na monokristalnim podlogama Si (100) orijentacije. Gredice su realizovane anizotropnim hemijskim nagrizanjem u sledecim vodenim rastvorima: 25 tez. % TMAH (tetrametilamonijum hidroksid) i 30 tez. % KOH. Temperatura nagrizanja je bila 80 ?C. SiO2 mikrogredice orijentisane u [110] pravcu na Si (100) podlozi se oslobadjaju ceonim podgrizanjem Si podloge i brzina realizacije gredice zavisi i od njene sirine i od njene duzine. Utvrdjene su i brzine nagrizanja SiO2 u ovim rastvorima i pokazalo se da promena debljine gredice, koja za ovako orijentisane gredice postoji po duzini, biva izrazenija u rastvorima KOH. Na SiO2 mikrogredicama ove orijentacije je opazena pojava mikroprskotina koje su objasnjene samim mehanizmom podgrizanja Si u cilju "oslobadjanja" mikrogredica ove orijentacije. SiO2 mikrogredice orijentisane u [110] pravcu na (100) Si podlozi se "oslobadjaju" bocnim podgrizanjem Si podloge i brzina njihove realizacije ne zavisi od duzine mikrogredice vec samo od njene sirine. Mikromostice od termicki deponovanog SiO2 je moguce realizovati anizotropnim hemijskim nagrizanjem u razmatranim rastvorima samo kada su orijentisani u [100] pravcu na (100) Si podlozi. . |
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ISSN: | 0352-5139 1820-7421 |
DOI: | 10.2298/JSC0711127J |