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Dimension dependence of current injection path in GaInN/GaN multi-quantum-shell (MQS) nanowire-based light-emitting diode arrays

To light emitting diodes (LEDs), solving the common non-uniform current injection and efficiency degradation issues in (0001) plane micro-LED is essential. Herein, we investigated the light emission characteristics of various mesa sizes and different p-electrode areas toward the realization of coaxi...

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Published in:Nanophotonics (Berlin, Germany) Germany), 2023-07, Vol.12 (15), p.3077-3087
Main Authors: Katsuro, Sae, Lu, Weifang, Ito, Kazuma, Nakayama, Nanami, Inaba, Soma, Shima, Ayaka, Yamamura, Shiori, Jinno, Yukimi, Sone, Naoki, Huang, Kai, Iwaya, Motoaki, Takeuchi, Tetsuya, Kamiyama, Satoshi
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cited_by cdi_FETCH-LOGICAL-c548t-d8b719bdfd09729bb8719ca746c2ad5676801bf6d915cba73d699c87944434e43
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creator Katsuro, Sae
Lu, Weifang
Ito, Kazuma
Nakayama, Nanami
Inaba, Soma
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Sone, Naoki
Huang, Kai
Iwaya, Motoaki
Takeuchi, Tetsuya
Kamiyama, Satoshi
description To light emitting diodes (LEDs), solving the common non-uniform current injection and efficiency degradation issues in (0001) plane micro-LED is essential. Herein, we investigated the light emission characteristics of various mesa sizes and different p-electrode areas toward the realization of coaxial GaInN/GaN multi-quantum-shell (MQS) nanowires (NWs)-based micro-LEDs. As the mesa area was reduced, the current leakage decreases, and further reduction of the area showed a possibility of realizing micro-LED with less current leakage. The large leakage path is mainly associated with the defective MQS structure on the (0001) plane area of each NW. Therefore, more NWs involved in an LED chip will induce higher reverse leakage. The current density-light output density characteristics showed considerably increased electroluminescence (EL) intensity as the mesa area decreased, owing to the promoted current injection into the efficient NW sidewalls under high current density. The samples with a mesa area of 50 × 50 µm showed 1.68 times higher light output density than an area of 100 × 100 µm under a current density of 1000 A/cm . In particular, the emission from (1-101) and (10-10) planes did not exhibit an apparent peak shift caused by the quantum-confined Stark effect. Furthermore, by enlarging the p-electrode area, current can be uniformly injected into the entire chip with a trade-off of effective injection to the sidewall of each NW. High performance of the MQS NW-based micro-LED can be expected because of the mitigated efficiency degradation with a reducing mesa area and an optimal dimension of p-electrode.
doi_str_mv 10.1515/nanoph-2023-0051
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In particular, the emission from (1-101) and (10-10) planes did not exhibit an apparent peak shift caused by the quantum-confined Stark effect. Furthermore, by enlarging the p-electrode area, current can be uniformly injected into the entire chip with a trade-off of effective injection to the sidewall of each NW. 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subjects Current density
Current injection
current injection path
Current leakage
Degradation
Electrodes
electroluminescence (EL)
Emission analysis
Gallium nitrides
ITO area
Light emission
Light emitting diodes
Luminous intensity
micro-LED
MQS nanowire
Nanowires
p-electrode area
Stark effect
title Dimension dependence of current injection path in GaInN/GaN multi-quantum-shell (MQS) nanowire-based light-emitting diode arrays
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