Magnetic Force Microscopy of Multiferroic Bulk Ceramic Oxides

Bulk multiferroic ceramics have been extensively studied due to their great potential for magneto-electric coupling applications such as low-power and multifunctional nano-electronic devices. In most of these studies the macroscopic magnetic performance was investigated, while the magnetic response...

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Bibliographic Details
Published in:Crystals (Basel) 2023-05, Vol.13 (5), p.838
Main Authors: Uršič, Hana, Šadl, Matej, Prah, Uroš, Fišinger, Val
Format: Article
Language:English
Subjects:
Analysis
applied external magnetic field
bulk ceramic oxides
Ceramics
Electronic devices
Epoxy resins
Ferromagnetism
Hard disks
Image resolution
Magnetic domains
Magnetic fields
Magnetic force microscopy
Microscope and microscopy
Microscopy
Multiferroic materials
multiferroics
Nanoelectronics
Nanotechnology devices
Oxides
Thin films
Topography
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Summary:Bulk multiferroic ceramics have been extensively studied due to their great potential for magneto-electric coupling applications such as low-power and multifunctional nano-electronic devices. In most of these studies the macroscopic magnetic performance was investigated, while the magnetic response on the micro- and nano-scale was not examined in detail. Local magnetic phenomena can be studied using magnetic force microscopy (MFM), a technique derived from atomic force microscopy. MFM measures the magnetic force between the magnetised tip and the magnetic sample. It is one of the most used methods to characterise the structure of ferromagnetic domains, because the sample preparation is simple, non-destructive and provides a relatively high-resolution image. In this review paper we focus on the MFM analyses of bulk multiferroic ceramics. The core of the article is divided into four sections: the introduction, the preparation of samples prior to MFM examination, the reviews of MFM analyses performed on bulk multiferroic ceramics with and without external magnetic fields, and finally the conclusions and an outlook for the future.
ISSN:2073-4352
2073-4352
DOI:10.3390/cryst13050838