Loading…

Exciton–phonon coupling strength in single-layer MoSe2 at room temperature

Single-layer transition metal dichalcogenides are at the center of an ever increasing research effort both in terms of fundamental physics and applications. Exciton–phonon coupling plays a key role in determining the (opto)electronic properties of these materials. However, the exciton–phonon couplin...

Full description

Saved in:
Bibliographic Details
Published in:Nature communications 2021-02, Vol.12 (1), p.1-9, Article 954
Main Authors: Li, Donghai, Trovatello, Chiara, Dal Conte, Stefano, Nuß, Matthias, Soavi, Giancarlo, Wang, Gang, Ferrari, Andrea C., Cerullo, Giulio, Brixner, Tobias
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Single-layer transition metal dichalcogenides are at the center of an ever increasing research effort both in terms of fundamental physics and applications. Exciton–phonon coupling plays a key role in determining the (opto)electronic properties of these materials. However, the exciton–phonon coupling strength has not been measured at room temperature. Here, we use two-dimensional micro-spectroscopy to determine exciton–phonon coupling of single-layer MoSe 2 . We detect beating signals as a function of waiting time induced by the coupling between A excitons and A ′ 1 optical phonons. Analysis of beating maps combined with simulations provides the exciton–phonon coupling. We get a Huang–Rhys factor ~1, larger than in most other inorganic semiconductor nanostructures. Our technique offers a unique tool to measure exciton–phonon coupling also in other heterogeneous semiconducting systems, with a spatial resolution ~260 nm, and provides design-relevant parameters for the development of optoelectronic devices. The exciton–phonon coupling (EXPC) affects the opto-electronic properties of atomically thin semiconductors. Here, the authors develop two-dimensional micro-spectroscopy to determine the EXPC of monolayer MoSe 2 .
ISSN:2041-1723
2041-1723
DOI:10.1038/s41467-021-20895-0