Image contrast reversals in contact resonance atomic force microscopy

Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be att...

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Bibliographic Details
Published in:AIP advances 2015-02, Vol.5 (2), p.027116-027116-6
Main Authors: Ma, Chengfu, Chen, Yuhang, Wang, Tian
Format: Article
Language:English
Subjects:
ATOMIC FORCE MICROSCOPY
Damping
EVALUATION
FLEXIBILITY
GRAPHITE
Image contrast
Inversions
MATERIALS SCIENCE
Mechanical properties
Microscopes
Microscopy
Pyrolytic graphite
Quantitative analysis
RESONANCE
SPECTRA
Stiffness
Surface geometry
SURFACES
Vibrational spectra
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Description
Summary:Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be attributed to structure-induced variations of tip-sample contact mechanics. Contact stiffness and damping at HOPG step edges exhibit significant increases relative to those in the flat regions. For quantitative evaluation of mechanical properties in CR-AFM, coupling effects of the surface geometry must be considered.
ISSN:2158-3226
2158-3226
DOI:10.1063/1.4908037