Study the Effect of Cu Doping on Optical and Structural Properties of NiO Thin Films

• Published in: Analele Universității de Vest din Timișoara. Seria Fizicǎ 2020-12, Vol.62 (1), p.15-22
• Main Authors: Benramache, Said, Benhaoua, Boubaker, Guezzoun, Hanane
• Format: Article
• Language: English
• Subjects: Chloride; Chlorides; Copper; Crystallization; Dehydration; Electrical conductivity; Electrical resistivity; Energy; Film thickness; Gas sensors; Gases; Glass substrates; Molecular beam epitaxy; Nickel oxides; NiO; Optical properties; Physical properties; polycrystalline structure; Sensors; Spain coater method; Spin coating; Thin films
• ISSN: 1224-9718; 1224-9718; 2784-1057
• DOI: 10.2478/awutp-2020-0002

In this work, copper doped nickel oxide as the thin films have been elaborated by a spin coating method, the nickel chloride hexahydrate (0.8M) and copper (II) chloride dehydrate (Cu/Ni = 0, 2.15, 4.3, 8.6 and 12.9 At.%) were used to prepare the Cu doped NiO thin films. The Cu doped NiO thin films were heated at a crystallization temperature of 600 °C with 2 h. The obtained thin films by spin coater method have a film thickness in the order of 400 nm. The prepared Cu doped NiO thin films have a polycrystalline with cubic structure (200) peak was observed. The optical property shows that the prepared thin films have a transmittance of about 70 %. The Cu doped NiO thin films have minimum bandgap energy is 3.85 eV at 12.9 at.%, the thin film deposited at 8.6 at.% has the highest value of Urbach energy is 425 meV. The Cu doped NiO thin films have a high electrical conductivity of 8.6 at% it is 7 (Ω.cm) . The prepared Cu doped NiO thin film was suitable for gas sensing applications due to the existing phase and higher electrical conductivity.