Computation of aberration coefficients for plane-symmetric reflective optical systems using Lie algebraic methods

The Lie algebraic method offers a systematic way to find aberration coefficients of any order for plane-symmetric reflective optical systems. The coefficients derived from the Lie method are in closed form and solely depend on the geometry of the optical system. We investigate and verify the results...

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Bibliographic Details
Published in:EPJ Web of conferences 2022, Vol.266, p.2002
Main Authors: Barion, Antonio, Anthonissen, Martijn J. H., ten Thije Boonkkamp, Jan H. M., IJzerman, Wilbert L.
Format: Article
Language:English
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Summary:The Lie algebraic method offers a systematic way to find aberration coefficients of any order for plane-symmetric reflective optical systems. The coefficients derived from the Lie method are in closed form and solely depend on the geometry of the optical system. We investigate and verify the results for a single reflector. The concatenation of multiple mirrors follows from the mathematical framework.
ISSN:2100-014X
2100-014X
DOI:10.1051/epjconf/202226602002