A Calibration Method for System Parameters in Direct Phase Measuring Deflectometry

Phase measuring deflectometry has been widely studied as a way of obtaining the three-dimensional shape of specular objects. Recently, a new direct phase measuring deflectometry technique has been developed to measure the three-dimensional shape of specular objects that have discontinuous and/or iso...

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Bibliographic Details
Published in:Applied sciences 2019-04, Vol.9 (7), p.1444
Main Authors: Deng, Xiaoting, Gao, Nan, Zhang, Zonghua
Format: Article
Language:English
Subjects:
Accuracy
Calibration
Cameras
Coordinates
Data processing
Depth of field
direct phase measuring deflectometry
Fourier transforms
fringe reflection
Lasers
Machine vision
Markers
Matrix algebra
Matrix methods
Measurement techniques
Methods
Phase matching
specular surface measurement
system parameter calibration
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Summary:Phase measuring deflectometry has been widely studied as a way of obtaining the three-dimensional shape of specular objects. Recently, a new direct phase measuring deflectometry technique has been developed to measure the three-dimensional shape of specular objects that have discontinuous and/or isolated surfaces. However, accurate calibration of the system parameters is an important step in direct phase measuring deflectometry. This paper proposes a new calibration method that uses phase information to obtain the system parameters. Phase data are used to accurately calibrate the relative orientation of two liquid crystal display screens in a camera coordinate system, by generating and displaying horizontal and vertical sinusoidal fringe patterns on the two screens. The results of the experiments with an artificial specular step and a concave mirror showed that the proposed calibration method can build a highly accurate relationship between the absolute phase map and the depth data.
ISSN:2076-3417
2076-3417
DOI:10.3390/app9071444