Two-Step Matching Approach to Obtain More Control Points for SIFT-like Very-High-Resolution SAR Image Registration

Airborne VHR SAR image registration is a challenging task. The number of CPs is a key factor for complex CP-based image registration. This paper presents a two-step matching approach to obtain more CPs for VHR SAR image registration. In the past decade, SIFT and other modifications have been widely...

Full description

Saved in:
Bibliographic Details
Published in:Sensors (Basel, Switzerland) Switzerland), 2023-04, Vol.23 (7), p.3739
Main Authors: Deng, Yang, Deng, Yunkai
Format: Article
Language:English
Subjects:
Affine transformations
Algorithms
C band
CPs
Data acquisition
Image registration
Methods
Registration
Remote sensing
SITF-OCT
Synthetic aperture radar
VHR SAR image
Wavelet transforms
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Airborne VHR SAR image registration is a challenging task. The number of CPs is a key factor for complex CP-based image registration. This paper presents a two-step matching approach to obtain more CPs for VHR SAR image registration. In the past decade, SIFT and other modifications have been widely used for remote sensing image registration. By incorporating feature point location affine transformation, a two-step matching scheme, which includes global and local matching, is proposed to allow for the determination of a much larger number of CPs. The proposed approach was validated by 0.5 m resolution C-band airborne SAR data acquired in Sichuan after the 2008 Wenchuan earthquake via a SAR system designed by the IECAS. With the proposed matching scheme, even the original SIFT, which is widely known to be unsuitable for SAR images, can achieve a much larger number of high-quality CPs than the one-step SIFT-OCT, which is tailored for SAR images. Compared with the classic one-step matching approach using both the SIFT and SITF-OCT algorithms, the proposed approach can obtain a larger number of CPs with improved precision.
ISSN:1424-8220
1424-8220
DOI:10.3390/s23073739