Enhanced Light-Induced Transverse Thermoelectric Effect in Tilted BiCuSeO Film via the Ultra-thin AuNPs Layer

Significant enhancement of light-induced transverse thermoelectric (LITT) effect in tilted BiCuSeO film has been achieved via introduction of an ultra-thin layer of gold nanoparticles (AuNPs) with the thickness of a few nanometers. In both cases of pulsed and continuous light irradiation, about two...

Full description

Saved in:
Bibliographic Details
Published in:Nanoscale research letters 2019-12, Vol.14 (1), p.367-6, Article 367
Main Authors: Yu, Weiyuan, Yan, Guoying, Xue, Yuli, Zhang, Yuejiao, Wang, Jianglong, Fu, Guangsheng, Wang, Shufang
Format: Article
Language:English
Subjects:
c-axis tilted BiCuSeO film
Chemistry and Materials Science
Electric potential
Gold
Incident light
Irradiation
Light effects
Light irradiation
Light-induced transverse thermoelectric (LITT) effect
Materials Science
Molecular Medicine
Nano Express
Nanochemistry
Nanoparticles
Nanoscale Science and Technology
Nanotechnology
Nanotechnology and Microengineering
Radiation
Sensitivity
Thermoelectricity
Thickness
Ultra-thin AuNPs layer
Voltage
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Significant enhancement of light-induced transverse thermoelectric (LITT) effect in tilted BiCuSeO film has been achieved via introduction of an ultra-thin layer of gold nanoparticles (AuNPs) with the thickness of a few nanometers. In both cases of pulsed and continuous light irradiation, about two times increment in the LITT voltage sensitivity is observed for the BiCuSeO film coated with 4-nm-thick AuNPs layer. This can be ascribed to the increased photo-thermal conversion efficiency in the LITT effect owing to the efficient usage of the incident light of AuNPs layer. Thicker AuNPs layer will suppress the voltage sensitivity increment due to the electrical connectivity effect. This work provides an effective strategy for optimizing the performance of thermal-type optical detectors based on the LITT effect.
ISSN:1931-7573
1556-276X
DOI:10.1186/s11671-019-3190-9