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Advanced materials nanocharacterization
This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsa...
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| Published in: | Nanoscale research letters 2011-01, Vol.6 (1), p.107-107, Article 107 |
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| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
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| Citations: | Items that cite this one |
| Online Access: | Get full text |
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| cited_by | cdi_FETCH-LOGICAL-b558t-6e836db7155bf4a5ec4c9fcded6e9c13c93180eb4c1e5066749e145cfdf5dc963 |
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| container_end_page | 107 |
| container_issue | 1 |
| container_start_page | 107 |
| container_title | Nanoscale research letters |
| container_volume | 6 |
| creator | Giannazzo, Filippo Eyben, Pierre Baranowski, Jacek Camassel, Jean Lányi, Stefan |
| description | This special issue of
Nanoscale Research Letters
contains scientific contributions presented at the Symposium D
"Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors"
of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13
th
to 17
th
September, 2010. |
| doi_str_mv | 10.1186/1556-276X-6-107 |
| format | article |
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Nanoscale Research Letters
contains scientific contributions presented at the Symposium D
"Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors"
of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13
th
to 17
th
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Nanoscale Research Letters
contains scientific contributions presented at the Symposium D
"Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors"
of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13
th
to 17
th
September, 2010.</description><subject>Advanced Materials Nanocharacterization</subject><subject>Chemistry and Materials Science</subject><subject>Editorial</subject><subject>Materials Science</subject><subject>Molecular Medicine</subject><subject>Nanochemistry</subject><subject>Nanoscale Science and Technology</subject><subject>Nanotechnology</subject><subject>Nanotechnology and Microengineering</subject><issn>1556-276X</issn><issn>1931-7573</issn><issn>1556-276X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>DOA</sourceid><recordid>eNp1kc1P3DAQxa0KVCjtmRvixinF49hOckEC1A8kpF5A4mY548mSVWKDnUWCvx5vQ1esVE623nv6jT2PsUPg3wFqfQpK6UJU-q7QBfDqE9vfKDvv7nvsS0pLzmXFK_2Z7QmoALQQ--zk3D1Zj-SORztR7O2Qjr31Ae9ttLhWXuzUB_-V7XbZo29v5wG7_fnj5vJ3cf3n19Xl-XXRKlVPhaa61K6t8uS2k1YRSmw6dOQ0NQglNiXUnFqJQIprXcmGQCrsXKccNro8YFcz1wW7NA-xH218NsH25q8Q4sLYOPU4kEFZQy0cL1EpqTpqRC05AJfS8Sy0mXU2sx5W7UgOyU_RDlvQbcf392YRnkwpAEBBBlzMgLYPHwC2HQyjWS_drJdutMmVZMjJ2ytieFxRmszYJ6RhsJ7CKpm6kqJphC5z8nROYgwpReo2k4Cbdd3_YR-9_-Em_6_fHOBzIGXLLyiaZVhFnxv8kPkKk061nQ</recordid><startdate>20110131</startdate><enddate>20110131</enddate><creator>Giannazzo, Filippo</creator><creator>Eyben, Pierre</creator><creator>Baranowski, Jacek</creator><creator>Camassel, Jean</creator><creator>Lányi, Stefan</creator><general>Springer New York</general><general>BioMed Central Ltd</general><general>Springer</general><general>SpringerOpen</general><scope>C6C</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>5PM</scope><scope>DOA</scope></search><sort><creationdate>20110131</creationdate><title>Advanced materials nanocharacterization</title><author>Giannazzo, Filippo ; Eyben, Pierre ; Baranowski, Jacek ; Camassel, Jean ; Lányi, Stefan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-b558t-6e836db7155bf4a5ec4c9fcded6e9c13c93180eb4c1e5066749e145cfdf5dc963</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Advanced Materials Nanocharacterization</topic><topic>Chemistry and Materials Science</topic><topic>Editorial</topic><topic>Materials Science</topic><topic>Molecular Medicine</topic><topic>Nanochemistry</topic><topic>Nanoscale Science and Technology</topic><topic>Nanotechnology</topic><topic>Nanotechnology and Microengineering</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Giannazzo, Filippo</creatorcontrib><creatorcontrib>Eyben, Pierre</creatorcontrib><creatorcontrib>Baranowski, Jacek</creatorcontrib><creatorcontrib>Camassel, Jean</creatorcontrib><creatorcontrib>Lányi, Stefan</creatorcontrib><collection>SpringerOpen</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>Nanoscale research letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Giannazzo, Filippo</au><au>Eyben, Pierre</au><au>Baranowski, Jacek</au><au>Camassel, Jean</au><au>Lányi, Stefan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Advanced materials nanocharacterization</atitle><jtitle>Nanoscale research letters</jtitle><stitle>Nanoscale Res Lett</stitle><addtitle>Nanoscale Res Lett</addtitle><date>2011-01-31</date><risdate>2011</risdate><volume>6</volume><issue>1</issue><spage>107</spage><epage>107</epage><pages>107-107</pages><artnum>107</artnum><issn>1556-276X</issn><issn>1931-7573</issn><eissn>1556-276X</eissn><abstract>This special issue of
Nanoscale Research Letters
contains scientific contributions presented at the Symposium D
"Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors"
of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13
th
to 17
th
September, 2010.</abstract><cop>New York</cop><pub>Springer New York</pub><pmid>21711622</pmid><doi>10.1186/1556-276X-6-107</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1556-276X |
| ispartof | Nanoscale research letters, 2011-01, Vol.6 (1), p.107-107, Article 107 |
| issn | 1556-276X 1931-7573 1556-276X |
| language | eng |
| recordid | cdi_doaj_primary_oai_doaj_org_article_c48182d03c5545fe9284011044d0545b |
| source | Publicly Available Content (ProQuest); IngentaConnect Journals; PubMed Central |
| subjects | Advanced Materials Nanocharacterization Chemistry and Materials Science Editorial Materials Science Molecular Medicine Nanochemistry Nanoscale Science and Technology Nanotechnology Nanotechnology and Microengineering |
| title | Advanced materials nanocharacterization |
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