Research on the Gate Oxide Layer Aging Trend of Power Electronic Device

The introduction of fully electric vehicles (FEVs) into the mainstream has raised concerns about the reliability of their electronic components such as Insulated Gate Bipolar Translator (IGBT). At present, only the transient thermal resistance curve in the datasheet and the initial thermal model of...

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Bibliographic Details
Published in:IEEE access 2021, Vol.9, p.48474-48482
Main Authors: Xu, Guoqing, Shao, Lingfeng, Wei, Weiwei, Zhang, Yanhui, Sun, Xuecheng
Format: Article
Language:English
Subjects:
accelerated aging experiment
Aging
Algorithms
Capacitance
Component reliability
Electric vehicles
Electronic components
Insulated gate bipolar transistor
Insulated gate bipolar transistors
Logic gates
Mann-Kendall test method
Parameters
Regression analysis
Reliability
stepwise regression algorithm
Switches
Temperature measurement
Thermal analysis
Thermal resistance
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Summary:The introduction of fully electric vehicles (FEVs) into the mainstream has raised concerns about the reliability of their electronic components such as Insulated Gate Bipolar Translator (IGBT). At present, only the transient thermal resistance curve in the datasheet and the initial thermal model of the experimental test are used to evaluate the life of the IGBT module, while it is well known that IGBT parameters are affected by its degree of aging. Thus, the development of research for the aging process of IGBT is of key importance. The aging process of IGBT is proposed to be a gradual aging process, verified by the accelerated aging experiment. Firstly, the mechanism between the relevant aging parameters and the degree of IGBT aging is studied in this paper. Secondly, the switching parameters in different degrees of aging are measured and compared by accelerated experiments. Finally, the stepwise linear regression algorithm is used to screen parameters and the Mann-Kendall test method is used to analyze the IGBT aging process curve. The results show that the aging process of IGBT is gradual, and the aging process model of IGBT is finally established. On this basis, the remaining using life of IGBT can be accurately measured.
ISSN:2169-3536
2169-3536
DOI:10.1109/ACCESS.2021.3062465