Two-dimensional quantitative near-field phase imaging using square and hexagonal interference devices

We demonstrate the formation of the near field with non-trivial phase distribution using surface plasmon interference devices, and experimental quantitative imaging of that phase with near-field phase microscopy. The phase distribution formed with a single device can be controlled by the polarizatio...

Full description

Saved in:
Bibliographic Details
Published in:Nanophotonics (Berlin, Germany) Germany), 2022-09, Vol.11 (19), p.4375-4386
Main Authors: Dvořák, Petr, Klok, Pavel, Kvapil, Michal, Hrtoň, Martin, Bouchal, Petr, Krpenský, Jan, Křápek, Vlastimil, Šikola, Tomáš
Format: Article
Language:English
Subjects:
Aperture
Electric components
Glass substrates
Gold
Imaging
Interference
interference nanostructures
Mathematical models
Microscopy
Near fields
near-field
Numerical analysis
Optics
Phase distribution
phase imaging
Phase objects
Plane waves
Polaritons
Propagation
SNOM
SPP waves
Wave propagation
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We demonstrate the formation of the near field with non-trivial phase distribution using surface plasmon interference devices, and experimental quantitative imaging of that phase with near-field phase microscopy. The phase distribution formed with a single device can be controlled by the polarization of the external illumination and the area of the device assigned to the object wave. A comparison of the experimental data to a numerical electromagnetic model and an analytical model assigns the origin of the near-field phase to the out-of-plane electric component of surface plasmon polaritons, and also verifies the predictive power of the models. We demonstrate a formation of near-field plane waves with different propagation directions on a single device, or even simultaneously at distinct areas of a single device. Our findings open the way to the imaging and tomography of phase objects in the near field.
ISSN:2192-8614
2192-8606
2192-8614
DOI:10.1515/nanoph-2022-0215