Parent Grain Reconstruction in an Additive Manufactured Titanium Alloy

Electron backscatter diffraction (EBSD) is an excellent tool for characterizing the crystallographic orientation aspects of the microstructure of polycrystalline material. In some additively manufactured materials, the material may undergo a phase transformation during the forming process. Although...

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Bibliographic Details
Published in:Metals (Basel ) 2024-01, Vol.14 (1), p.51
Main Authors: Wright, Stuart I., Lenthe, William C., Nowell, Matthew M.
Format: Article
Language:English
Subjects:
Additive manufacturing
Algorithms
Cobalt
Crystallography
EBSD
Electron backscatter diffraction
Grain boundaries
Grain size
Microstructure
Orientation
orientation gradient
Parent and child
parent grain reconstruction
parent microstructure reconstruction
Phase transitions
Plastic flow
Reconstruction
Specialty metals industry
Titanium alloys
Titanium base alloys
Titanium industry
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Summary:Electron backscatter diffraction (EBSD) is an excellent tool for characterizing the crystallographic orientation aspects of the microstructure of polycrystalline material. In some additively manufactured materials, the material may undergo a phase transformation during the forming process. Although EBSD can only characterize the final microstructure, neighbor information from orientation mapping allows the microstructure before the phase transformation to be reconstructed, provided that the parent–child orientation relationship is known. An investigation of the effectiveness of the reconstruction algorithms for capturing the grain size as well as orientation gradients is undertaken with a focus on additively manufactured Ti-alloy. The EBSD results, coupled with reconstruction algorithms, reveal information on the prior grain size as well as the plastic flow of the material.
ISSN:2075-4701
2075-4701
DOI:10.3390/met14010051