On the observation of dispersion in tunable second-order nonlinearities of silicon-rich nitride thin films

We present experimental results on second-harmonic generation in non-stoichiometric, silicon-rich nitride films. The as-deposited film presents a second-order nonlinear coefficient, or χ(2), as high as 8 pm/V. This value can be widely tuned using the electric field induced second harmonic effect, an...

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Bibliographic Details
Published in:APL photonics 2019-03, Vol.4 (3), p.36101-036101-6
Main Authors: Lin, Hung-Hsi, Sharma, Rajat, Friedman, Alex, Cromey, Benjamin M., Vallini, Felipe, Puckett, Matthew W., Kieu, Khanh, Fainman, Yeshaiahu
Format: Article
Language:English
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Summary:We present experimental results on second-harmonic generation in non-stoichiometric, silicon-rich nitride films. The as-deposited film presents a second-order nonlinear coefficient, or χ(2), as high as 8 pm/V. This value can be widely tuned using the electric field induced second harmonic effect, and a maximum value of 22.7 pm/V was achieved with this technique. We further illustrate that the second-order nonlinear coefficient exhibited by these films can be highly dispersive in nature and require further study and analysis to evaluate their viability for in-waveguide applications at telecommunication wavelengths.
ISSN:2378-0967
2378-0967
DOI:10.1063/1.5053704