Analysis of Modified Kies Exponential Distribution with Constant Stress Partially Accelerated Life Tests under Type-II Censoring

This study investigates, for the first time, the product of spacing estimation of the modified Kies exponential distribution parameters as well as the acceleration factor using constant-stress partially accelerated life tests under the Type-II censoring scheme. Besides this approach, the conventiona...

Full description

Saved in:
Bibliographic Details
Published in:Mathematics (Basel) 2022-03, Vol.10 (5), p.819
Main Authors: Nassar, Mazen, Alam, Farouq Mohammad A.
Format: Article
Language:English
Subjects:
Accelerated life tests
Confidence intervals
constant-stress partially accelerated life tests
Data analysis
Electron mobility
Estimates
Failure
Insulation
Investigations
Lifetime
Mathematics
maximum likelihood estimation
maximum product of spacing estimation
Mean time to failure
modified Kies exponential distribution
Monte Carlo simulation
Parameter modification
Probability distribution functions
Product reliability
Reliability aspects
Survival analysis
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This study investigates, for the first time, the product of spacing estimation of the modified Kies exponential distribution parameters as well as the acceleration factor using constant-stress partially accelerated life tests under the Type-II censoring scheme. Besides this approach, the conventional maximum likelihood method is also considered. The point estimates and the approximate confidence intervals of the unknown parameters are obtained using the two methods. In addition, two parametric bootstrap confidence intervals are discussed based on both estimation methods. Extensive simulation studies are conducted by considering different censoring schemes to examine the efficiency of each estimation method. Finally, two real data sets for oil breakdown times of insulating fluid and minority electron mobility are analyzed to show the applicability of the different methods. Moreover, the reliability function and the mean time-to-failure under the normal use condition are estimated using both methods. Based on Monte Carlo simulation outcomes and real data analysis, we recommend using the maximum product of spacing to evaluate both the point and interval estimates for the modified Kies exponential distribution parameters in the presence of constant-stress partially accelerated Type-II censored data.
ISSN:2227-7390
2227-7390
DOI:10.3390/math10050819