Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays

• Published in: IUCrJ 2020-03, Vol.7 (Pt 2), p.276-286
• Main Authors: Niozu, Akinobu, Kumagai, Yoshiaki, Nishiyama, Toshiyuki, Fukuzawa, Hironobu, Motomura, Koji, Bucher, Maximilian, Asa, Kazuki, Sato, Yuhiro, Ito, Yuta, Takanashi, Tsukasa, You, Daehyun, Ono, Taishi, Li, Yiwen, Kukk, Edwin, Miron, Catalin, Neagu, Liviu, Callegari, Carlo, Di Fraia, Michele, Rossi, Giorgio, Galli, Davide E, Pincelli, Tommaso, Colombo, Alessandro, Owada, Shigeki, Tono, Kensuke, Kameshima, Takashi, Joti, Yasumasa, Katayama, Tetsuo, Togashi, Tadashi, Yabashi, Makina, Matsuda, Kazuhiro, Nagaya, Kiyonobu, Bostedt, Christoph, Ueda, Kiyoshi
• Format: Article
• Language: English
• Subjects: angular correlations; Chemical Physics; Chemical Sciences; Clusters; Computer simulation; Crystal defects; Crystal structure; crystalline defects; Crystallinity; Defects; Diffraction patterns; Diffraction theory; Free electron lasers; Ions; Mechanics; Mechanics of materials; Nanoparticles; or physical chemistry; Physics; Research Papers; single nanoparticles; Single shot characterization; Spatial resolution; Stacking faults; structure determination; Theoretical and; X-ray diffraction; X-ray scattering; X-rays; Xenon; xfels
• ISSN: 2052-2525; 2052-2525
• DOI: 10.1107/s205225252000144x

Characterizing and controlling the uniformity of nanoparticles is crucial for their application in science and technology because crystalline defects in the nanoparticles strongly affect their unique properties. Recently, ultra-short and ultra-bright X-ray pulses provided by X-ray free-electron lasers (XFELs) opened up the possibility of structure determination of nanometre-scale matter with Å spatial resolution. However, it is often difficult to reconstruct the 3D structural information from single-shot X-ray diffraction patterns owing to the random orientation of the particles. This report proposes an analysis approach for characterizing defects in nanoparticles using wide-angle X-ray scattering (WAXS) data from free-flying single nanoparticles. The analysis method is based on the concept of correlated X-ray scattering, in which correlations of scattered X-ray are used to recover detailed structural information. WAXS experiments of xenon nanoparticles, or clusters, were conducted at an XFEL facility in Japan by using the SPring-8 Ångstrom compact free-electron laser (SACLA). Bragg spots in the recorded single-shot X-ray diffraction patterns showed clear angular correlations, which offered significant structural information on the nanoparticles. The experimental angular correlations were reproduced by numerical simulation in which kinematical theory of diffraction was combined with geometric calculations. We also explain the diffuse scattering intensity as being due to the stacking faults in the xenon clusters.