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Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning
Defect inspection is essential in the semiconductor industry to fabricate printed circuit boards (PCBs) with minimum defect rates. However, conventional inspection systems are labor-intensive and time-consuming. In this study, a semi-supervised learning (SSL)-based model called PCB_SS was developed....
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Published in: | Sensors (Basel, Switzerland) Switzerland), 2023-03, Vol.23 (6), p.3246 |
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description | Defect inspection is essential in the semiconductor industry to fabricate printed circuit boards (PCBs) with minimum defect rates. However, conventional inspection systems are labor-intensive and time-consuming. In this study, a semi-supervised learning (SSL)-based model called PCB_SS was developed. It was trained using labeled and unlabeled images under two different augmentations. Training and test PCB images were acquired using automatic final vision inspection systems. The PCB_SS model outperformed a completely supervised model trained using only labeled images (PCB_FS). The performance of the PCB_SS model was more robust than that of the PCB_FS model when the number of labeled data is limited or comprises incorrectly labeled data. In an error-resilience test, the proposed PCB_SS model maintained stable accuracy (error increment of less than 0.5%, compared with 4% for PCB_FS) for noisy training data (with as much as 9.0% of the data labeled incorrectly). The proposed model also showed superior performance when comparing machine-learning and deep-learning classifiers. The unlabeled data utilized in the PCB_SS model helped with the generalization of the deep-learning model and improved its performance for PCB defect detection. Thus, the proposed method alleviates the burden of the manual labeling process and provides a rapid and accurate automatic classifier for PCB inspections. |
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Thus, the proposed method alleviates the burden of the manual labeling process and provides a rapid and accurate automatic classifier for PCB inspections.</description><subject>Algorithms</subject><subject>Circuit boards</subject><subject>Circuit printing</subject><subject>Deep learning</subject><subject>defect inspection</subject><subject>Defects</subject><subject>Image acquisition</subject><subject>Inspection</subject><subject>Labeling</subject><subject>Machine learning</subject><subject>Model accuracy</subject><subject>noisy training</subject><subject>printed circuit board</subject><subject>Printed circuit boards</subject><subject>Printed circuits</subject><subject>Quality control equipment</subject><subject>semi-supervised learning</subject><subject>Semiconductor industry</subject><issn>1424-8220</issn><issn>1424-8220</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><sourceid>DOA</sourceid><recordid>eNpdksFu1DAQhi0EoqVw4AVQJC5wSPHYThyfULulsNJKIJWeLceeLF5l7cVOKvH2eNl21SIfxpr5_Hv-0RDyFug554p-yozTljPRPiOnIJioO8bo80f3E_Iq5w2ljHPevSQnvFUKVNOdkuUVDmin6gqnEnwMlQ_Vj-TDhK5a-GRnP1WX0SSXq9vsw7q6wa2vb-YdpjufC7RCk0IpvCYvBjNmfHMfz8jt9Zefi2_16vvX5eJiVduGqqnuDTgl-g44F8Iy05iBFg9SDEwKaKDpLPRoARkAl7LjVEnEnjqQCgEFPyPLg66LZqN3yW9N-qOj8fpfIqa1NmnydkSNolOuU4LSthFgho41DUdljZK2b50pWp8PWru536KzGKZkxieiTyvB_9LreKeB0qa0x4vCh3uFFH_PmCe99dniOJqAcc6aScWKu9JAQd__h27inEKZ1Z4CSSmIveD5gVqb4sCHIZaPbTmuzN3GgIMv-QspuOItbaE8-Hh4YFPMOeFwbB-o3q-HPq5HYd899nskH_aB_wXL6rI6</recordid><startdate>20230319</startdate><enddate>20230319</enddate><creator>Pham, Thi Tram Anh</creator><creator>Thoi, Do Kieu Trang</creator><creator>Choi, Hyohoon</creator><creator>Park, Suhyun</creator><general>MDPI AG</general><general>MDPI</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>K9.</scope><scope>M0S</scope><scope>M1P</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>7X8</scope><scope>5PM</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0002-5681-2492</orcidid><orcidid>https://orcid.org/0009-0001-2163-8965</orcidid></search><sort><creationdate>20230319</creationdate><title>Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning</title><author>Pham, Thi Tram Anh ; 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subjects | Algorithms Circuit boards Circuit printing Deep learning defect inspection Defects Image acquisition Inspection Labeling Machine learning Model accuracy noisy training printed circuit board Printed circuit boards Printed circuits Quality control equipment semi-supervised learning Semiconductor industry |
title | Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning |
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