A Screening Technique for Establishing the Stability of Metal Film Resistors

A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.

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Bibliographic Details
Published in:Active and passive electronic components 1978-01, Vol.5 (2), p.71-77
Main Authors: Goswami, A. P., Satyanarayana, L., Sivaji, N. V. M.
Format: Article
Language:English
Online Access:Get full text
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Description
Summary:A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.
ISSN:0882-7516
1563-5031
DOI:10.1155/APEC.5.71